Рус
Eng
AFM Probes shop
Ask online
+1-480-493-0093
Leading the Way in Nanoscale Analysis
Products
Applications
Scan-Gallery
Resources
About us
Contact us
Home
Resources
Webinars
Webinars
Image Processing and Analysis in Scanning Probe Microscopy: Key Aspects and Recipes
Dr. Stanislav I. Leesment
28.04.2019
AFM Applications for Smart and Functional Materials Studies
Dr. Stanislav I. Leesment
18.04.2019
AFM-Raman, SNOM and TERS: Recent Advances and Applications
Dr. Artem Shelaev
21.03.2019
ScanTronic™: a Shortcut to Reliable AFM Results
Dr. Vyacheslav Polyakov
25.02.2019
AFM integration with Laser Spectroscopy: Challenges, Solutions, Advantages
Dr. Artem Shelaev
18.01.2018
Rebirth of Force Spectroscopy: HybriD AFM Mode
Arseny Kalinin
15.11.2017
Nanoscale IR Microscopy and Spectroscopy
Dr. Vyacheslav Polyakov
11.10.2017
Data Processing and Representation in Atomic Force Microscopy
Dr. Stanislav I. Leesment
25.05.2016
Compositional imaging of complex materials with atomic force microscopy
Dr. Sergei Magonov
26.04.2016
New Developments in AFM Oscillatory Resonance Modes: Frequency Imaging and Frequency Modulation
Dr. Sergei Magonov
28.05.2015
Basic Principles of AFM Advanced Modes & Applications
Dr. Stanislav I. Leesment
16.07.2014
Beyond the Diffraction Limit: AFM Integration with Light
Dr. Pavel Dorozhkin
04.06.2014
TITANIUM - the revolutionary step in AFM design
Dr. Sergei Magonov
20.02.2014
New HD-AFM Mode; Your Path to Controlling Forces for Precise Material Properties
Dr. Virgil Elings and Dr. Sergei Magonov
23.05.2013
Raman-AFM & Tip Enhanced Raman Scattering (TERS). Pushing the limits of resolution and sensitivity in chemical imaging
Dr. Pavel Dorozhkin
26.03.2013
AFM imaging of DNA related structures
Prof. Dr. Alexander Kotlyar
20.08.2012
Magnetic Force Microscopy – Modern Approaches and Application Examples
Dr. S.O. Demokritov
25.07.2012
Tip Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging
Dr. Pavel Dorozhkin
17.07.2012
Challenges and Solutions in Practical Atomic Force Microscopy
Dr. Sergei Magonov
15.02.2012
News
06.05.2019
Participation of NT-MDT Spectrum Instruments in spring conferences in Europe
30.04.2019
Webinars from NT-MDT Spectrum Instruments: Spring activity
Upcoming events
International Scanning Probe Microscopy Conference 2019
May, 26-29, 2019
2019 Spring Meeting of the European Materials Research Society
May, 27-31, 2019
Applications
Learn more
Features
Learn more
Scan-Gallery
Learn more
NT-MDT Spectrum Instruments
