Scanning Near-Field Optical Microscopy: Relevant Insights and Trends
NT-MDT Spectrum Instruments is happy to invite you to our new webinar
“Scanning Near-Field Optical Microscopy: Relevant Insights and Trends”.
Scanning near-field optical microscopy (SNOM), or near-field scanning optical microscopy (NSOM) is a microscopy technique for nanostructure investigation that breaks the far-field resolution limit by exploiting the properties of evanescent waves. This technique has been intensively used in nanophotonics (plasmonics, photonic crystals & waveguides, etc.), laser technology, optical micro-devices and material science studies.
During the webinar our lecturer, Dr. Artem Shelaev will introduce the latest insights from the field of SNOM. New instrumental solutions will be introduced and the latest SNOM-based publications will be reviewed.
Webinar will take place on Wednesday, November the 20th 4PM-5PM GMT (8AM-9AM PST).
Presenter: Dr. Artem Shelaev, Leading Application Scientist