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Scanning Near-Field Optical Microscopy: Relevant Insights and Trends

31.10.2019

NT-MDT Spectrum Instruments proudly introduces the recording of the webinar presented by Dr. Artem Shelaev:
“Scanning Near-Field Optical Microscopy: Relevant Insights and Trends”.

The webinar took place on the November the 20th, 2019.

Scanning near-field optical microscopy (SNOM), or near-field scanning optical microscopy (NSOM) is a microscopy technique for nanostructure investigation that breaks the far-field resolution limit by exploiting the properties of evanescent waves. This technique has been intensively used in nanophotonics (plasmonics, photonic crystals & waveguides, etc.), laser technology, optical micro-devices and material science studies.

During the webinar our lecturer, Dr. Artem Shelaev has introduced the latest insights from the field of SNOM. New instrumental solutions were described and the latest SNOM-based publications were reviewed.

Scanning Near-Field Optical Microscopy: Relevant Insights and Trends (15 Mb)

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