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Products

AFM-Raman-Nano-IR Systems

Integration of AFM with cutting-edge optical methods for scientific research

NTEGRA Spectra II
Versatile automated AFM-Raman, SNOM and TERS system
NTEGRA Nano IR
Ultralow drift advanced AFM & IR s-SNOM imaging and spectroscopy

Modular AFM

AFM systems for wide applications. Configuration possibilities for a special task.

NTEGRA
Modular scanning probe microscope NTEGRA, configuration possibilities for a special task.

Automated AFM

Easy-to-use AFM / STM systems for wide range research

NEXT II
Intended for wide application automated monoblock AFM/STM measurement system with a built-in video microscope
VEGA
Cutting-edge Atomic Force Microscope for large and multiple samples

Specialized AFM

SOLVER Nano
Atomic Force Microscope for Research & Education.
SOLVER Pipe II
Atomic Force Microscope for in situ nondestructive testing in industrial settings
Intelligent ScanTronic™ Software
Make amplitude modulation AFM easy for researchers of every skill level.
RapidScan™
Speed up your AFM by an order of magnitude.
HybriD Mode™
Empowering simultaneous mapping of various material properties.
PX Ultra Controller
The new digital controller PX Ultra turns your routine SPM device into easy-to-use instrument for scientific breakthroughs and advanced research.
Thermal Cabinet
NT-MDT SI is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.
SThM - Scanning Thermal Microscopy
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.
Mass changes measurements
Combination of QCM with dissipation monitoring with AFM allows to carry out simultaneous in situ observation of object topography (up to nm) and mass change (up to 0.3 ng).

Applications

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Features

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Scan-Gallery

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