Leading the Way in Nanoscale Analysis
AFM Probes shop
Control Electronics HD 2.0. HybriD Mode™
Empowering simultaneous mapping of various material properties.
PX Ultra Controller
The new digital controller PX Ultra turns your routine SPM device into easy-to-use instrument for scientific breakthroughs and advanced research.
Speed up your AFM by an order of magnitude.
NT-MDT SI is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.
Cutting-edge AFM-RAMAN-SICM System for Biological Studies
SThM - Scanning Thermal Microscopy
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.
SOLVER Pipe II
Atomic Force Microscope for in situ nondestructive testing in industrial settings
Intelligent ScanT™ Software
Make amplitude modulation AFM easy for researchers of every skill level.
NT-MDT SI Exhibits at Last Months Conferences
Microscopy and Microanalysis 2023
July 24-27, 2023
NT-MDT Spectrum Instruments