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SPM-2019-RCWDFM Joint International Conference will combine the 3rd International Conference "Scanning Probe Microscopy" (SPM), the 4th Russia-China Workshop on Dielectric and Ferroelectric Materials (RCWDFM), International Youth Conference “Functional Imaging of Nanomaterials”, and exhibition of nanotechnological equipment.
August 25-28, 2019
March 27-29, 2019
Starting from 1997-1998 the annual International Symposium «Nanophysics and Nanoelectronics” continues regular discussions on topical issues in such areas as the physics of semiconductor nanostructures, X-ray optics and scanning probe microscop.
March 11-14, 2019
Starting from 1997-1998 the annual International Symposium «Nanophysics and Nanoelectronics” continues regular discussions on topical issues in such areas as the physics of semiconductor nanostructures, X-ray optics and scanning probe microscop.
March 04-08, 2019
Boston, Massachusetts
November 25-30, 2018
Suzdal, Russia
November 8, 2018

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