Leading AFM in Nanoscale Analysis
NT-MDT II introduces NTEGRA II, a second generation of the most popular AFM in the world.
With added capabilities, enhanced functionalities, it delivers an unprecedent level of modularity and flexibility becoming a true partner of a researcher.
Intelligent, fast, reliable, precise and, undeniably, easy to use.
To phase out influence of noisy environments, NTEGRA II comes with a standard enclosure that provides temperature control, acoustic and vibration isolation.
Such combination reveals a true nature of NTEGRA II as the most stable AFM in the world that delivers a thermal drift at less than 0.2 nm/min level.
Program has been developed with the help of neural networks to provide auto-tuning of scanning parameters for imaging in AM-AFM.
Automatic maintenance of attractive (non-contact) & repulsive (intermittent-contact) regimes.
Artefact-free scanning without parachuting. Perfect performance at samples with any kind of morphology.
NTEGRA II enables scans for up to 10 Hz with standard cantilevers (resonance frequency <500 kHz) and up to 25 Hz with short cantilevers (resonance frequency >1 MHz).
No additional hardware and software are required.
Open architecture in hardware, software, and signal integration provides a portal for you to customize and expand this list to fit your applications.
Until nowadays NTEGRA concept remains unsurpassed. It was designed specifically to form an AFM based platform within cutting edge methods from other scientific analyses such as raman spectroscopy and nanoIR spectroscopy.
NTEGRA II create a core around which your lab can build a full spectrum of analytical operations.
NTEGRA II offers an elegant solution. Universal platform design, universal electronics, universal software.
No matter what the configuration, NTEGRA II will retain its excellent quality and performance.
The HybriDTM is now an AFM standard mode that enables quantitative nano-mechanical measurements to provide researches with Young modulus maps, maps of adhesion, deformation, etc.
Furthermore, implementation of non-oscillatory technique in electrical modes, such as conductive AFM, PFM, KPFM, allows now researchers to work with fragile and loosely fixed samples.
In HybriD mode (US Patient 9,110,092) the tip-sample distance is modulated according to the harmonic law. Thus tip enters a force interaction with the sample thousands times per second.
High-performance electronic components and unique algorithms implemented in the state-of-the-art HybriD 2.0 Control Electronics provide superb level of real-time signal processing and analysis. Combining mode with cutting-edge optical microscopy and spectroscopy techniques opens-up novel opportunities of cantilever-based tip-enhanced Raman scattering (TERS) and scattering scanning near-field optical microscopy (s-SNOM).
Spectrum processing in real-time & offline.
Wavelength change in a single click.
Lasers, gratings, polarizers, pinholes and so on, are fully automated & controlled from the single software.
Integration with spectra databases
More than 100 methods for AFM-Raman data processing & analysis
Powerful toolkit for AFM image leveling
Smart package for automatic practical detection Nonlimited number of copies under onsite license.
ISO-ASME-compatible statistical analysis.
The module is a powerful tool for controlling the AFM measuring system.
The main element of the module is an interac- tive block diagram of the device.
With its help, the operations of organizing the work- ing block diagram of the device, generation, syn- chronous detection and switching of signals, control of digital filtering, organization of feedback systems, etc. are carried out.
When working according to the standard methods included in the NOVA PX program, all switches in the controller are carried out automatically when the measurement method is selected.
Scan AFM head for measurements in liquid and gas environment in basic AFM modes.
Scanner: Scanning range – X,Y,Z 100х100х10 um.
AFM Z noise down to 20 pm.
Cantilever oscillations registration - up to 5 MHz.
Bias voltage – 500 kHz.
Tip-to-sample manual approach option.
Registration system: 650 nm (optionally 1300 nm) or SLD 850 nm.
Exchangeable probe holder for operation in liquid.
AFM-Raman head optimized for top/side/bottom illumination.
Manual probe registration system.
AFM Z noise down to 15 pm.
Optical access from top/side for objectives (WD>6 mm) or condenser (NA<0.3).
Optical access from bottom for objectives (including immersion objectives).
Includes removable AFM unit for cantilever probe.
Registration system 670 nm (optionally 830 or 1300 nm).
Change happens at interfaces and today’s most exciting changes in microscopy are happening where multiple technologies interface.
NTEGRA Spectra II is a prime example, uniting the full power of confocal microscopy, atomic force microscopy, Raman & fluorescence spectroscopy in one platform.
From topography to spectrum analysis, from electrical and mechanical properties to optical spatial resolution below the diffraction limit.
NTEGRA II combines the strengths of the excellent AFM with perfect optical microscope for biological and medical applications.
From molecules to living organisms, NTEGRA II opens the window to the world of biology and biochemistry. Especially designed to integrate seamlessly with your optical microscope, NTEGRA II preserves the in situ environment so that you can observe, image and measure what is really there.
To maintain life and present the best conditions for measurement, most biological samples must be kept in fluid solutions.
For conventional AFM biological imaging as well as biochemistry and bioorganic applications, NTEGRA II uses a unique sealed fluid cell which maintains an enclosed volume.
NTEGRA II is a high-sensitive system perfectly suited for measurements in vacuum up to 10-3 torr or under controlled atmosphere environments.
The widespread application AFM with enhanced MFM measurement capabilities in external magnetic field.
Contact AFM: LFM, FMM, SRI, PFM
AM-AFM: MFM, EFM, SCFM, KPFM
HybriD ModeTM: Young’s modulus, Work of Adhesion, Current, Force Volume, PFM, KPFM, MFM, EFM, Thermal Microscopy
AFM spectroscopy, SS PFM Nanolithography: Voltage, Current, Force Scanning Tunneling Microscopy
Vacuum
Temperature
Gases
Liquid
Electrochemical environment
External magnetic field Humidity
| Scan type | Scanning by sample | Scanning by probe | |
| Sample size | Up to ⌀40 mm, up to 15 mm in height | Up to ⌀100 mm in diameter, up to 15 mm in height | |
| Sample weight | Up to 100 g | Up to 300 g | |
| XY sample positioning range, resolution | 5x5 mm, 5 μm | ||
| Positioning sensitivity | 2 μm | ||
| Scan range | 100x100x10 μm | 100x100x10 μm | |
| Up to 200x200x20 μm (DualScanTM mode) | |||
| Non linearity, XY | ≤ 0.1% | ≤ 0.15% | |
| Noise level, Z (RMS in bandwidth 1000 Hz) |
0.04 nm (typically), 0.06 nm | 0.06 nm (typically), 0.07 nm | |
| Noise level, XY (RMS in bandwidth 200 Hz) |
0.2 nm (typically), 0.3 nm (XY 100 um) | 0.1 nm (typically), 0.2 nm (XY 50 um) | |
| Optical viewing system | Optical resolution | 3 μm (1μm optional; 0.4 μm optional, NA 0.7) |
3 μm |
| Field of view | 4.5-0.4 mm | 2.0-0.4 mm | |
| Continuous zoom | available | available | |
| Vibration isolation | Active 0.7-1000 Hz | ||
Measuring modes and techniques |
Contact AFM: Topography, Lateral Force, Force Modulation, Spreading Resistance Imaging |
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