The only open design AFM that delivers infinite capabilities
NTEGRA is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment.
The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.*
There are several scanning types implemented in NTEGRA : scanning by the sample, scanning by the probe and dual-scanning. On account of that, the system is ideal for investigating small samples with ultra-high resolution (atomic-molecular level) as well as for big samples and scanning range up to 100x100x10 µm.
The unique DualScan TM mode allows investigating even bigger fields on the surface (200x200 µm for X, Y and 22 µm for Z) that can be useful, for example, for living cells and MEMS components.
Built-in three axes closed loop control sensors trace the real displacement of the scanner and compensate unavoidable imperfections of piezoceramics as non-linearity, creep and hysteresis. The sensors, which are used by NT-MDT, have the lowest noise level, thus allowing working with closed loop control on the very small fields (down to 10x10 nm). This is especially valuable for carrying out nanomanipulation and lithography modes. NTEGRA has a built-in optical system with 1 µm resolution, which allows imaging the scanning process in real-time.
Due to the open architecture, the functionality of NTEGRA can be extended essentially: specialized magnetic measurements with external magnetic field, high-temperature experiments, Near-field optical microscopy, Raman spectroscopy, etc.
* E.g. the unique method of Atomic-Force Acoustic Microscopy (AFAM) allows investigating soft and hard samples with carrying out quantitative measurements of Young modulus in every scanning point. AFAM allows obtaining much better contrast as compared to Phase Imaging Mode for the soft objects, and makes possible the obtainment of contrast on the hard samples, what is a very hard task when one uses other methods.
|Scan type||Scanning by sample||Scanning by probe|
|Sample size||Up to ⌀40 mm, up to 15 mm in height||Up to ⌀100 mm in diameter, up to 15 mm in height|
|Sample weight||Up to 100 g||Up to 300 g|
|XY sample positioning range, resolution||5x5 mm, 5 μm|
|Positioning sensitivity||2 μm|
|Scan range||100x100x10 μm||100x100x10 μm|
|Up to 200x200x20 μm (DualScanTM mode)|
|Non linearity, XY||≤ 0.1%||≤ 0.15%|
|Noise level, Z
(RMS in bandwidth 1000 Hz)
|0.04 nm (typically), 0.06 nm||0.06 nm (typically), 0.07 nm|
|Noise level, XY
(RMS in bandwidth 200 Hz)
|0.2 nm (typically), 0.3 nm (XY 100 um)||0.1 nm (typically), 0.2 nm (XY 50 um)|
|Optical viewing system||Optical resolution||3 μm
0.4 μm optional, NA 0.7)
|Field of view||4.5-0.4 mm||2.0-0.4 mm|
|Vibration isolation||Active 0.7-1000 Hz|
Measuring modes and techniques
Contact AFM: Topography, Lateral Force, Force Modulation, Spreading Resistance Imaging