ScanT™: a Shortcut to Reliable AFM Results
NT-MDT Spectrum Instruments proudly introduces the recording of the webinar presented by Dr. Vyacheslav Polyakov:
"ScanT: a Shortcut to Reliable AFM Results"
The webinar took place on the February the 20th, 2019.
The webinar addressed to scanning parameter setting automatization for amplitude modulation AFM (AM-AFM).
Atomic Force Microscopy is a widely used and powerful technique for investigating materials at a nanoscale range. However, the technique is not simple to use, which elicits varied results between researchers with different levels of experience. Inspired by neural networks we have created the intelligent ScanT software to make amplitude modulation AFM (AM-AFM) easy for researchers of every skill level.
During the webinar the multiple examples how ScanT helps to avoid common AM-AFM artifacts will be introduced.