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AFM-Raman, SNOM and TERS: Recent Advances and Applications

21.03.2019

NT-MDT Spectrum Instruments proudly introduces the recording of the webinar presented by Dr. Artem Shelaev:
“AFM-Raman, SNOM and TERS: Recent Advances and Applications”.

The webinar took place on the March the 20th, 2019.

The webinar is dedicated to applications and new achievements of combined systems based on atomic force and optical microscopy.

Laser spectroscopy and atomic force microscopy (AFM) have become irreplaceable tools in many fields of science and technology. AFM provides electrical, mechanical and other physical properties with nanoscale resolution, but does not give information about chemical specificity. Laser spectroscopy, including Raman spectroscopy, Luminescence and Fluorescence on the contrary, fills this gap, but has a fundamental limitation - the spatial resolution. Integration of both techniques overcomes this gap. In our webinar we will review the latest advances in this area based on recently published papers in high-ranked scientific journals and give the examples of various solutions implemented within legendary NTEGRA SPECTRA system.

AFM-Raman, SNOM and TERS: Recent Advances and Applications (14.5 Mb)

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