Nanoscale IR Microscopy and Spectroscopy
Webinar took place on October 11, 2017.
Scattering near-field infrared microscopy (s-SNOM IR) is a quite known technique that allows to break the diffraction limit by conﬁning the light on the nanometer scale using a suitable probe and achieve down to 10 nm spatial resolution. In the meantime, it is less known that the key to successful s-SNOM IR is a high resolution and highly stable Atomic Force Microscope (AFM), which precisely controls the position of the probe and detects signals from it.
NT-MDT SI is happy to present a unique system which combines latest developments in AFM and s-SNOM techniques, called NTEGRA Nano IR – the most advanced system for Nanoscale IR Microscopy and Spectroscopy. In this webinar we show how the combination of low thermal drift and low noise AFM in combination with s-SNOM IR and other nearfield techniques helps to obtain perfect high resolution results on various samples.