NT-MDT Spectrum Instruments traditionally supports the International Scanning Probe Microscopy conference, which is the 19th this year and takes place in Kyoto, Japan.
NT-MDT Spectrum Instruments is going to participate the 3-rd Annual Research and Practical Conference of Nanotechnological Society of Russia, to take place in Moscow on March 30-31st
NT-MDT Spectrum Instruments has demonstrated enhancement of the Raman scattering (TERS) in application to an opaque sample in liquid with the upright optical configuration NTEGRA Spectra.
NT-MDT Spectrum Instruments is delighted to announce our participation at Sondes Locales 2017 in Montpellier Juvignac France from the 20th to 24th of March 2017.
NT-MDT Spectrum Instruments proudly participated at SAOG 2017. The 33rd SAOG Meeting which represented the Surface Science and Thin Films community of Switzerland which took place in the University of Fribourg, Switzerland on January 27th 2017.
NT-MDT, a leading provider of Atomic Force Microscopes (AFM), announced today a reorganization of its corporate structure to become NT-MDT Spectrum Instruments Group.
NT-MDT proudly exhibited at The European Materials Research Society (E-MRS) fall 2016 which was held in Warsaw University of Technology from September 19th to 22nd .
NT-MDT was proud to participate and sponsor TOPO 2016. This special AFM workshop by Oxford Instruments took place on August 16th – 19th in Technische Universitat Dresden, Germany 2016.
NT-MDT were proud to present the new NTEGRA Spectra II –automated AFM-RAMAN, SNOM and TERS system at this large congress which attracted almost 1,000 participants from over 50 countries.
