NT-MDT SI Exhibits at MRS Fall Meeting & Exhibit 2019
NT-MDT Spectrum Instruments would like to thank all participants and organizers of the Fall MRS conference held last week in Boston. It was a great show, all visitors of our booth were impressed with our latest developments in AFM area, especially with new mode for automated scanning in semicontact mode (also known as tapping) – ScanT™. If you didn’t have a chance to stop by our booth last week to discuss your applications or to find out about our latest AFM technologies, we encourage you to contact your local representative. We will be glad to address your questions, run samples and provide with demonstrations of our systems.
At this conference Dr. Stanislav Leesment made a report “Improvement of Time Domain Performance in Atomic Force Microscopy Feedback Controlled Electromagnetic Methods by Means of Image Reconstruction”.