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2.2.4.3 Appendices

1. Parabolic or spherical probe.

The model applies to probes with a spherical tip at small tip-sample separations . The same result is obtained generally for the parabolic tip.

(1)

In AFM measurements with silicon probe and sample at , , : .


2. Conical probe.

The model applies in case when tip curvature radius can be neglected as compared to tip-sample separation ( ).

(2)

In AFM measurements with silicon probe and sample at , , : .


3. Pyramidal probe.

The model applies in case when tip curvature radius can be neglected as compared to tip-sample separation ( ).

(3)

In AFM measurements with silicon probe and sample at , , : .


4. Conical probe with a rounded tip.

The model is a generalization of (1) and (2) at arbitrary ratio between and .

(4)

where . At (semispherical probe) formula (4) transforms into formula (1) while at (conical probe) – into formula (2).

In AFM measurements with silicon probe and sample at , , : .