Height image of texturized silicon surface after anisotropic etching, 4-microns z‑range scan obtained via contact mode.
Sample courtesy by Schelushkin Victor, Solex Co., Russia, Ryazan.
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Height image of texturized silicon surface after anisotropic etching, 4-microns z‑range scan obtained via contact mode.
Sample courtesy by Schelushkin Victor, Solex Co., Russia, Ryazan.
