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US Patent Office granted the patent No US 9,110, 092, B1 for non-resonant oscillatory AFM modes to NT-MDT

01.09.2015

On August 18, 2015 US Patent Office granted the patent No US 9,110, 092, B1 “Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory modes” to a group of NT-MDT employers.  The patent’s abstract states that the invention relates to a multi-purpose probe-based apparatus, to methods for providing images of surface topography, and to the detection and quantitative mapping of local mechanical and electromagnetic properties in the non-resonant oscillatory mode.

Simply put, this is the legal validation of the unique features of our Hybrid mode and its applications that will further strengthen our position at AFM market place.On August 18, 2015 US Patent Office granted the patent No US 9,110, 092, B1 “Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory modes” to a group of NT-MDT employers.  The patent’s abstract states that the invention relates to a multi-purpose probe-based apparatus, to methods for providing images of surface topography, and to the detection and quantitative mapping of local mechanical and electromagnetic properties in the non-resonant oscillatory mode.

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