The NT-MDT company prepared the new Corporate Brochure devoted to Scanning Probe Microscopes

NT-MDT: Customer, Technology, Integrity

Our primary goal is customer success in exploring the nanoworld with our innovative microscopes. We combine our strong motivation, fundamental knowledge, multi-year experience, hard-working ethics, and full integrity to make this possible.

The NT-MDT Way

NT-MDT has been involved in the development, production, and support of research instrumentation, primarily, scanning probe microscopes for nanotechnology and its applications. Our pathway has been marked by a creation of a few thousand different devices, whose functions and capabilities cover the broad range of customer needs in different areas: university education, academic and industrial research. NT-MDT pioneering efforts led to the impressive combination of scanning probe microscopy with Raman spectroscopy.

Our team of talented engineers and scientists is committed to provide ап excellent service to all of our customers in industry and academia worldwide. We cherish our stakeholders, work globally as а team to share ideas, technologies and talents, and constantly improve what we do.

Our vision is tо bе а second-to-none global manufacturer of microscopes for nanotechnology research, while upholding ап unparalleled standard of excellence.

An expanded set of resonance oscillatory AFM modes: - Amplitude modulation with Phase Imaging The surface profile and probe phase changes are detected and mapped while the probe frequency and amplitude are fixed.

- Amplitude modulation with Frequency Imaging The surface profile and probe frequency are detected and mapped while the probe amplitude and phase are fixed.

- Frequency modulation The surface profile and probe amplitude are detected and mapped while the probe frequency shift and phase are fixed.

• SPM heads for novice and expert users
• Apprentice toolkit
• Flexible choice of probes
• Compact design and affordable cost

NT-MDT Nano is a robust, small footprint SPM with a wide range of features:
- Educational head for STM & AFM intermittent contact mode by user made tips.
- Student toolkit to etch probes.
- Research head for most common AFM modes with commercially available tips.
- Routine imaging of nanoscale structures.

• Open architecture
• Tip/sample scanners
• Wide range of configurations/heads
• Broad temperature range

NTEGRA Prima – an Open-Architecture Modular Device for Advanced Research:
- Environmental and high-temperature measurements
- Specialized measurements with external magnetic fields
- Combination with Near-Field Optical Microscopy and Raman Spectroscopy
- Scanning in liquids with temperature control and flow-through capabilities
- Flexible scanning geometries and ranges

• Easy to use microscope with advanced capabilities
• Automated head exchange
• Automated laser/photodetector alignment
• Superscan and stitching capabilities

NEXT is a unique system that provides researchers with outstanding performance and a wide range of capabilities. Specifically, it removes gap between optics and SPM by offering the users surface imaging from mm range down to the atomic scale. The exceptional functioning and automation of the alignment routines of this microscope make it the best candidate for high throughput studies in multi-user environments.

• Unique solution for high-performance microscope environment
• Exceptional temperature stability
• Low-thermal drift medium
• Excellent acoustic and vibrational isolation

This new fan-free enclosure provides NT-MDT microscopes the capability to operate at conditions of extraordinary temperature stability within 5 millidegree  ˚C.
This guarantees the exceptionally low thermal drift of less than 0.2 nm/min. The cabinet also protects the positioned microscope from external acoustic and vibrational noises with passive and active means of damping.

• Co-localized AFM and optical measurements
• Near-field Optical Microscopy (SNOM/NSOM)
• Tip Enhanced Raman Scattering (TERS)
• With NT-MDT, Thermo Scientific, Renishaw and other spectrometers
• Focus track for optical measurements

NTEGRA Spectra is an integrated solution for simultaneous AFM and Confocal Raman, Fluorescence, SNOM, TERS measurements. The instrument supports multiple AFM/Optics geometries enabling studies both in air and liquid. Comprehensive characterization of materials is achieved in combined mapping of chemically specific Raman bands and local mechanical and electrical properties. Raman mapping with nanometer resolution can be obtained by means of TERS. Similar resolution can be achieved for studies of plasmonic materials.

• Upright (a)
• Inverted (b)
• Full transmission (“4-Pi”) (c)
• Side-Illumination (d)
• SNOM: Optical fibers (e) and “smart” probes (f)

The open-design of NTEGRA Spectra facilitates a broad spectrum of AFM/Optics applications for characterization of local chemical content, dielectric and plasmonic features in complex samples of various origins. They include polymers, carbon-based compounds, bio-materials, semiconductors etc. Spatial resolution of such measurements has approached the nanometer scale.

• Co-localized AFM and optical measurements
• Near-field Optical Microscopy (SNOM/NSOM)
• Tip Enhanced Raman Scattering (TERS)
• With NT-MDT, Thermo Scientific, Renishaw and other spectrometers
• Focus track for optical measurements

NTEGRA Spectra is an integrated solution for simultaneous AFM and Confocal Raman, Fluorescence, SNOM, TERS measurements. The instrument supports multiple AFM/Optics geometries enabling studies both in air and liquid. Comprehensive characterization of materials is achieved in combined mapping of chemically specific Raman bands and local mechanical and electrical properties. Raman mapping with nanometer resolution can be obtained by means of TERS. Similar resolution can be achieved for studies of plasmonic materials.

• Fast signal detection and FPGA processing
• PLL and multiple digital broadband lock-in amplifiers
• Full synergy with Px controller

Recently, NT-MDT microscopes were enhanced by the new Hybrid controller, which expands their instrumental and application capabilities by employing a high-speed (20 MHz) data acquisition and fast real-time data processing with FPGA at 80 MHz. New modes and applications are emerging with quantitative nanomechanical analysis in Hybrid mode being already routinely applied for elastic modulus mapping with 10-nm resolution. The expanded set of the oscillatory modes and other newly developed features (e.g. thermoelectric measurements) make the NT-MDT user the most powerful researcher compared to the practitioners of other SPM devices.