Webinar “Scanning Near-Field Optical Microscopy: Relevant Insights and Trends”
NT-MDT Spectrum Instruments is happy to invite you to our new webinar :
“Scanning Near-Field Optical Microscopy: Relevant Insights and Trends”
Scanning near-field optical microscopy (SNOM), or near-field scanning optical microscopy (NSOM) is a microscopy technique for nanostructure investigation that breaks the far-field resolution limit (Rayleigh criterion) by exploiting the properties of evanescent waves. This technique has been intensively used in nanophotonics (plasmonics, photonic crystals & waveguides, etc.), laser technology, optical micro-devices and material science studies.
During the webinar our lecturer, Dr. Artem Shelaev will introduce the latest insights from the field of SNOM. New instrumental solutions will be introduced and the latest SNOM-based publications will be reviewed. Webinar will take place on Wednesday, November the 20th 4PM-5PM GMT (8AM-9AM PST).
Presenter: Dr. Artem Shelaev, Leading Application Scientist
Please check your time zone at the registration page.
The record of our previous webinar “Image Processing and Analysis in Scanning Probe Microscopy: Key Aspects and Recipes” which was held on May the 15th 2019 can be found here.