Webinar ScanT™: a Shortcut to Reliable AFM Results

Webinar ScanT™: a Shortcut to Reliable AFM Results

February 20, 2019

NT-MDT Spectrum Instruments is excited to invite you to our first webinar ‘2019:
"ScanT™: a Shortcut to Reliable AFM Results"

Atomic Force Microscopy is a widely used and powerful technique for investigating materials at a nanoscale range. However, the technique is not simple to use, which elicits varied results between researchers with different levels of experience. Inspired by neural networks we have created the intelligent ScanT™ software to make amplitude modulation AFM (AM-AFM) easy for researchers of every skill level.

During the webinar the multiple examples how ScanT™ helps to avoid common AM-AFM artifacts will be introduced.
Webinar will take place on Wednesday, February the 20th 4PM-5PM GMT (8AM-9AM PST).

Register here

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