Atomic Force Microscopes for Nanotechnology, Scientific Research & Education

TITANIUM
AFM - Raman - SNOM
Modular AFM
Automated AFM
Practical AFM

NTEGRA Spectra II

Versatile automated AFM-Raman, SNOM
and TERS system
Versatile automated AFM-Raman, SNOM 

and TERS system

Solver Nano

Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force 

Microscope for Research & Education

HybriD Mode™

New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra, SPECTRUM and LIFE systems

TERS probes for nano-Raman imaging

Dedicated
AFM-Raman-TERS-SNOM instrumentation

•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS

NTEGRA Spectra

Interdisciplinary research at the nanometer scale:
AFM+Confocal Raman+SNOM+TERS
NTEGRA Spectra – Atomic Force 

Microscope integrated with Confocal Raman and  SNOM systems
Fully automated 

AFM/STM TITANIUM.  NT-MDT - AFM-probes, atomic force microscope (AFM, 

STM, SPM, RAMAN, SNOM)
Automated AFM-Raman-SNOM system for a wide range of applications
 
 

Archived webinars

Data Processing and Representation in Atomic Force Microscopy
Dr. Stanislav I. Leesment    
During the webinar we go through various examples of common image processing procedures such as flattening, filtering, etc. and show the ways of perceptual data representation. 

Thermal Cabinet

ULTRASTABLE THERMAL CABINET FOR NT-MDT MICROSCOPES.
Guaranteed the exceptionally low thermal drift of less than 0.2 nm/min. The cabinet also protects the positioned microscope from external acoustic and vibrational noises.
 
 
Copyright © 2015 - 2017, NT-MDT SI