Atomic Force Microscopes for Nanotechnology, Scientific Research & Education

AFM-Raman-Nano-IR Systems
Modular AFM
Automated AFM
Practical AFM

HybriD Mode™

New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra II, NTEGRA Nano IR systems

NTEGRA Spectra II

Versatile automated AFM- Raman, SNOM
and TERS system
Versatile automated AFM-Raman, SNOM 

and TERS system

NTEGRA Nano IR

Ultralow drift advanced AFM-IR & s-SNOM
imaging and spectroscopy
Versatile automated AFM-Raman, SNOM and TERS system

Solver Nano

Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force 

Microscope for Research & Education

VEGA

Cutting-edge Atomic Force Microscopy techniques
for large and multiple samples
Versatile automated AFM-Raman, SNOM and TERS system

TERS probes for nano-Raman imaging

•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS
 
 

Webinars

Rebirth of Force Spectroscopy: HybriD AFM Mode
NT-MDT S.I. is happy to present a new group of AFM and AFM-Optical combined modes based on fast force spectroscopy – HybriD mode (HD mode). Combination of the fast force spectroscopy with cutting-edge AFM and optical techniques opens-up absolutely new opportunities of AFM equipment.
In this webinar we will show the advantages of HD mode for fast quantitative nanomechanical and topography measurements, non-destructive conductive, piezoelectric, thermoelectric and thermal studies, cantilever-type TERS and scattering SNOM.

Webinar took place on Wednesday, 15th of November 2017 8:00 AM – 9:00 AM PST

Thermal Cabinet

ULTRASTABLE THERMAL CABINET FOR NT-MDT SI MICROSCOPES.
Guaranteed the exceptionally low thermal drift of less than 0.2 nm/min. The cabinet also protects the positioned microscope from external acoustic and vibrational noises.
 
 
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