Atomic Force Microscopes for Nanotechnology, Scientific Research & Education

AFM-Raman-Nano-IR Systems
Modular AFM
Automated AFM
Practical AFM

NTEGRA Spectra II

Versatile automated AFM- Raman, SNOM
and TERS system
Versatile automated AFM-Raman, SNOM 

and TERS system

NTEGRA Nano IR

Ultralow drift advanced AFM-IR & s-SNOM
imaging and spectroscopy
Versatile automated AFM-Raman, SNOM and TERS system

Solver Nano

Atomic Force Microscope for Research & Education
SOLVER Nano &ndash Atomic Force 

Microscope for Research & Education

VEGA

Cutting-edge Atomic Force Microscopy techniques
for large and multiple samples
Versatile automated AFM-Raman, SNOM and TERS system

HybriD Mode™

New AFM technique
Comprehensive materials characterization
Ultimate resolution, quantitative analysis
Morphological, mechanical, chemical, electric, magnetic and
other properties within a single scan

Compatible with: TITANIUM, NEXT, NTEGRA Prima,
NTEGRA Spectra II, NTEGRA Nano IR systems

TERS probes for nano-Raman imaging

•  Record breaking Raman enhancement factors
•  Nano-Raman spatial resolution: down 10nm
•  High speed TERS* mapping
•  Mass produced, based on serial AFM cantilevers
•  Complete commercial solution for TERS
 
 

Archived webinars

Data Processing and Representation in Atomic Force Microscopy
Dr. Stanislav I. Leesment    
During the webinar we go through various examples of common image processing procedures such as flattening, filtering, etc. and show the ways of perceptual data representation. 

Thermal Cabinet

ULTRASTABLE THERMAL CABINET FOR NT-MDT SI MICROSCOPES.
Guaranteed the exceptionally low thermal drift of less than 0.2 nm/min. The cabinet also protects the positioned microscope from external acoustic and vibrational noises.
 
 
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