Publications

R. V. Lapshin.
Feature-oriented scanning methodology for probe microscopy and nanotechnology.
Nanotechnology, vol. 15, iss. 9, pp. 1135-1151, 2004.

D.A. Lapshin, V.S. Letokhov, G.T. Shubeita, S.K. Sekatskii, G. Dietler.
Shear force distance control in a scanning near-field optical microscope: in resonance excitation of the fiber probe versus out of resonance excitation.
Ultramicroscopy 99 (2004) 227

S.A. Gavrilov, V. M. Roschin, A.V. Zheleznyakova, R.V. Lapshin, E.A. Poltoratsky, G.S. Rychkov, N.N. Dzbanovsky, N.N. Suetin.
AFM investigation of highly ordered nanorelief formation by anodic treatment of aluminum surface.
Phisics, chemistry and application of nanostructures 2003, pages 500-502

A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev
Nanostructured carbon coatings on polyethylene films.
Russian Journal of Applied Chemistry, vol. 76, no. 9, pp. 1497-1501, 2003.

R. V. Lapshin.
Object-oriented scanning for probe microscopy and nanotechnology.
Ph. D. abstract, the Institute of Physical Problems, Moscow, 2002.

Rostislav V. Lapshin.
Digital data readback for a probe storage device.
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 71, NUMBER 12, pp. 4607-4610, 2000

R. V. Lapshin.
Automatic lateral calibration of tunneling microscope scanners.
Review of Scientific Instruments, vol. 69, no. 9, pp. 3268-3276, 1998