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SOLVER Nano

Atomic Force Microscope for Research & Education.

AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.

Applications

Scientific research

Solver Nano - AFM for science.

Solver Nano is designed by the NT-MDT team that also created High Performancel Systems like Ntegra, NEXT and Spectra which have been proven in the scientific community through many key publications.

Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.

These capabilities enable all of the basic (SPM Principles) AFM techniques in compact SPM design.


Because the SolverNano can be employed in diverse areas of research as AFM tool, several research examples are shown below:

  1. Polymers
  2. Bio objects
  3. Carbon Materials

The following samples were provided by Customers: Nitrocellulose membrane, Celgard, Polystyrene Polybutadiene (PS/PBD), Graphene.


Configuration and experimental setup:

  • Solver Nano with AFM head.
  • CL 100 um piezotube scanner. CL enabled.
  • Digital controller.
  • Active vibration isolation.
  • Results from intermittent contact mode (topography, phase, and amplitude image).


NSC_05/20° whisker cantilever was used which has a spring constant of 13 N/m and a resonance of 210 kHz.

Scanning parameters: 4.0x4.0 um scanning area with 512x512 points, and scanning rate of 1 Hz.


Sample: Nitrocellulose membrane.

Intermittent Contact mode results from a Nitrocellulose membrane sample.

Topography

Topography with section line

Cross section profile



Sample: Microporous Polypropylene (PP) Membrane (Celgard),

Intermittent Contact mode results from a Celgard sample;
A NSC_05/20° whisker cantilever was used which has a force constant of 13 N/m and resonance of 210 kHz.

Scanning parameters: 20 x 20 um and 5x5 um scanning areas with 512x512 points, and scanning rate of 3 Hz

Topography

Phase

Topography with section line

Cross section profile

Scanning parameters: 2.5x2.5 um scanning area with 512x512 points, and scanning frequency of 30 Hz

Topography

Phase

Topography with section line

Cross section profile



Sample: Polystyrene Polybutadiene (PS/PBD).

Intermittent Contact mode results from a phase separated blend of Polystyrene Polybutadiene (PS/PBD).
A NSC_05/20° whisker cantilever was used which has a spring constant of 12 N/m and a resonance of 201 kHz.

Scanning parameters: 20 x 20 um and 5x5 um scanning areas with 512x512 points, and scanning rate of 2.5 Hz.

Topography

Phase

Topography (5x5 um)

Phase



Sample: Long DNA

It is important to note that all data was collected during an on-site demonstration without any filters applied to adjust the raw data. Intermittent Contact mode results from long stands of DNA/Mica sample;
A NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 80 kHz. Topography, amplitude and phase image were recorded simultaneously

Scanning parameters: 2.0x2.0 um scanning area with 512x512 points, and scanning rate of 0.8 Hz

Topography

Phase

Amplitude

Topography with section line

Cross section profile

Topography with section line

Cross section profile



Sample: Short DNA on Mica

Intermittent Contact mode results from short strands on DNA/Mica sample.
A NSG03 cantilever was used which has a force constant of 2 N/m and resonance of 80 kHz. Topography and phase images were recorded simultaneously.

Scanning parameters: 1.5x1.5 um scanning area with 512x512 points, and scanning frequency of 0.7 Hz.

Topography

Phase

Topography with section line

Cross section profile



Sample: Circular DNA on Mica

Intermittent Contact mode results from circular DNA/Mica sample.
A NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 80 kHz. Topography, amplitude and phase images were recorded simultaneously.

Scanning parameters: 900x900 nm scanning area with 512x512 points, and scanning rate of 0.5 Hz.

Topography

Phase

Amplitude

Topography with section line

Cross section profile



Sample: Graphene on Si substrate

Topography and surface potential image were recorded simultaneously
A NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 90 kHz. Topography and surface potential were recorded simultaneously.

Scanning parameters: 5.0x5.0 um scanning area with 512x512 points, and scanning rate of 1.1 Hz.

Topography

Topography with section line

Cross section profile

Surface potential


Metrology control

SOLVER Nano for metrology applications.

SOLVER Nano AFM can be used for educational / scientific projects as well as for routine measurements. It can also be used as a metrological tool for the determination of linear dimensions of objects in the nanometer range.

Technical requirements for metrology appliocations:

  • Large field scanner – 100x100 um piezotube scanner.
  • High level XYZ linearity - < 0.1%
  • Low noise XY sensor – < 0.3 nm in closed loop, < 0.05 nm open loop
  • Low noise Z sensor – < 0.04 nm in closed loop, < 0.01 nm open loop
  • Precision capacitance sensors.
  • Professional software with the common metrological protocols.

Sample: Metrology test sample TDG, period 278 nm.

Signal: Topography.
Scanning parameters: 10.0x10.0 um scanning area with 512x512 points, and scanning rate of 2 Hz

Topography

FFT Power spectrum with cross section line

Texture direction, Std 33.750 deg
Texture direction index, Stdi 0.295
Radial Wavelength, Srw 4.998 um
Radial Wavelength Index, Srwi 0.0494
Wavelength 0.277 um
Frequency 3.606 1/um
Function Value 9.806 nm^2
X 2.000 1/um
Y -3.000 1/um
Angle -56.309 deg.

Metrological protocol

Sample: Metrology test sample TGG, period 3 um.

Signal: Topography.
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning rate of 1 Hz.

Topography (3D)

Topography (2D)

FFT Power spectrum with cross section line

Texture direction, Std -89.030 deg
Texture direction index, Stdi 0.0515
Rad. Wavelength, Srw 2.999 um
Rad. Wavelength Index, Srwi 0.0143
Wavelength 2.999 um
Frequency 0.333 1/um
Function Value 0.0537 nm^2
X 0.333 1/um
Y -0.000000000000000256 1/um
Angle 0.070 deg.

Metrological protocol

Sample: Metrology test sample TGZ2, period 3 um, relief height 94 nm.

Signal: Topography.
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning frequency of 2 Hz

Topography


Topography Height Histogram

FFT Power spectrum with cross section line

Texture direction, Std 88.945 deg
Texture direction index, Stdi 0.0421
Rad. Wavelength, Srw 2.999 um
Rad. Wavelength Index, Srwi 0.0167
Wavelength 2.999 um
Frequency 0.333 1/um
Function Value 557.454 nm^2
X 0.333 1/um
Y -0.000000000000000256 1/um
Angle 0.000 deg.

Metrological protocol

Sample: Metrology test sample TGQ, period 3 um, height 19 nm.

Signal: Topography.
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning rate of 3 Hz.

Topography (3D)

Topography (2D)

Topography Height Histogram

FFT Power spectrum with hor. cross section line

Texture direction, Std -89.296 deg
Texture direction index, Stdi 0.150
Rad. Wavelength, Srw 2.999 um
Rad. Wavelength Index, Srwi 0.0571
Wavelength 2.999 um
Frequency 0.333 1/um
Function Value 5.926 nm^2
X 0.333 1/um
Y -0.000000000000000256 1/um
Angle 0.000 deg.

Metrological protocol

FFT Power spectrum with vert. cross section line

Texture direction, Std -89.296 deg
Texture direction index, Stdi 0.150
Rad. Wavelength, Srw 2.999 um
Rad. Wavelength Index, Srwi 0.0571
Wavelength 2.999 um
Frequency 0.333 1/um
Function Value 2.450 nm^2
X -0.000000000000000256 1/um
Y 0.333 1/um
Angle 90.000 deg.

Metrological protocol

Specifications

Atomic Force Microscopy

Contact AFM
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Force Modulation microscopy
Piezoresponse Force Microscopy

Amplitude modulation AFM
Intermittent contact mode
Phase Imaging mode
Semicontact Error mode
Non-Contact mode
Electrostatic Force Modes
Contact EFM

EFM
Scanning Capacitance Microscopy
Kelvin Probe Force Microscopy

MFM
DC MFM
AC MFM
Dissipation Force Microscopy

AFM Spectroscopies
Force-distance curves
Adhesion Force imaging
Amplitude-distance curves
Phase-distance curves
Frequency-distance curves
Full-resonance Spectroscopy

STM techniques
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
I(z) Spectroscopy
I(V) Spectroscopy

Lithographies
AFM Oxidation Lithography
STM Lithography
AFM Lithography - Scratching
AFM Lithography - Dynamic Plowing

HD Modes

General specs:

Scanner   100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner
AFM resolution   0.01 nm
Environments   Air and liquid measurements.
Combined video optical microscopes  
Build in 100x optical USB microscope
External 500x optical microscope
Design   Table-top, affordable, robust and user-friendly
Scanner    
Scanning field   High voltage regime: 100x100x12 um
Low voltage regime: 3x3x3 um
Scanner type       Metrological piezotube XYZ scanner with sensors
Sensors type   XYZ – ultrafast capacitance sensors
Sensors noise   Low noise XY sensor: < 0.3 nm
Metrological Z sensor: < 0.03 nm
Sensors linearity       Metrological XY sensor: < 0.1%
Metrological Z sensor: < 0.1%
Overall scanner parameters   100x100x12 um with CL
Resolution: XY -0.3 nm, Z – 0.03 nm
Linearity: XY - < 0.1%, Z - < 0.1%
3x3x3 um with OL. Resolution: XY -0.05 nm,
Z – 0.01 nm

Sample
Sample positioning range   12 mm
Sample positioning resolution   1.5 um
Sample dimension   up to 1,5” X 1,5” X 1/2”,   35x35x12 mm
Sample weight   up to 100 g
Approach system type   Z – Stepper Motor
Approach system step size   230 nm
Approach system speed rate   10 mm per min
Algorithm Gentle approach   Available (probe guaranteed to stop before it touches the sample)

Scanning Heads
AFM head for Si cantilever   Available. All commercial cantilevers can be used
Type of cantilever detection   Laser/Detector Alignment
Probe holders   Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting   Cinematically mount. Mount accuracy 150 nm
(Remove/mount accuracy)
STM AFM head for wire probes   Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements
Type of cantilever detection   Piezo for AFM measurement
Probe holders   Probe holder for air and liquid measurements

Controllers. Digital professional controller
Number of images can be acquired during one scanning cycle   Up to 16
Image size   Up to 8Kx8K scan size
ADC   500 kHz 16-bit ADC
12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000)
Individual filter on each channel
DSP   Floating point 320 MHz DSP
Digital FB   Yes 6 Channels
DACs:   4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage
2 16-bit DAC for user output
XYZ scanner control voltage   High-voltage outputs: X, -X, Y, -Y, Z, -Z
at -150 V to +150 V
Low-voltage mode XY ± 10 V
XY RMS noise in 1000 Hz bandwidth   0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth   0.3 ppm RMS
XY bandwidth   4 kHz (LV regime – 10 kHz)
Z bandwidth   9 kHz
Maximal current of XY amplifiers   1.5 mA
Maximal current of Z amplifiers   8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors      Yes
Open/Closed-loop mode for X,Y controlх   Yes
Generator frequency setting range   DC – 5 MHz
Deflection registration channel bandwidth   170 Hz-5 MHz
Lateral Force registration channel bandwidth   170 Hz -5 MHz
2 additional registration channel bandwidth   170 Hz -5 MHz
Bias Voltage   ± 10 V bandwidth 0 – 5 MHz
Modulating signals supply   To the probe (external output);
High-voltage X,Y, Z channels
(including LV regime);
Bias Voltage
Number of generators for modulation, user accessible   2,  0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs   Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs   6
Additional digital outputs   1
I2C bus   Yes
    Macro language
Max. cable length between the controller and SPM base or measuring heads   2 m
Computer interface   USB 2.0
Voltage supply   110/220 V
Power consumption   ≤ 110 W

Software for SPM operation and Data processing

Software written by programmers NT-MDT and specialized management probe microscopes and associated devices (external and build-in) and also signal and image processing obtained with SPM. This software is used to manage all SPM from NT-MDT, but adapted for each model (Next, Ntegra, Solver Nano). In the case of use with Solver Nano, the software interface as much as possible easy and user-friendly.

Operation Interface

  • User-defined configurable GUI
  • Basic and advanced GUI layouts
  • Handy hardware configuration wizard
  • Quick access for all main parameters
  • Quick access to customized scripts
  • Automatic single-click setup for all available techniques
  • Interactive Help system

Laser alignment

  • Handy indication for laser alignment

Resonance

  • Automatic configuration for standard probes
  • Automatic resonance tune and phase adjustment

Approach

  • Automatic routine for tip-sample engagement
  • Soft Approach gentle engagement routine
  • Handy stepper motor control
  • Real time engagement oscilloscope

Scan

  • Up to 8 sumultaneous signal channels
  • Up to 8K points
  • Automated single-click scanning mode setup
  • Handy scan area selection tool
  • Two pass techniques
  • Cyclic mode
  • Pause tool
  • PreScan regime
  • OverScan regime
  • Angle scanning
  • Non-square pixel mode
  • Live 3D view
  • Quick access to main scanning parameters via Parameters panel
  • Quick access to main tuning operations via Quick panel
  • Automatic PID setup
  • Adaptive scan
  • Cross-sections for each and all scans
  • Full-screen mode

Curves

  • Variety of standard modes
  • Available arguments: Height, BV, Frequency, SetPoint
  • Up to 3 channels measured simultaneously
  • Limits for each channel
  • Independent setup for resolution and speed for trace and retrace
  • Point/Multi Point/Line/Grid measurement modes

Lithography

  • Vector/Raster techniques
  • Constant/Pulse/Gradient regimes
  • Force/Voltage/Current modes
  • Handy CAD for vector lithography
  • Support for main graphical standards for raster lithography
  • Scan Area / Litho Mask transparent overlay

Tools

  • Oscilloscope
    • Real time signal control
    • Average and RMS calculation
    • Up to 4 simultaneous signals in the same window
    • Multi-window view
    • 4 different plot modes
    • User markers for measurements
    • Data save/export
    • Trigger mode to synchronize with other processes
  • Scheme
    • Graphical control for controller schematics
    • Access to digital filters
    • Access to all Feedbacks parameters
  • Closed-loop automatic setup and control
  • Camera for optical view layout
  • Scripting and Automation
    • Nova PowerScirpt language for customized automation
    • Support for external dll
    • LabView support
    • Script Panel for quick access to frequently used scripts
    • Automation for all routine setup procedures

Data Processing and Analysis

Data presentation

  • 1D/2D/3D View/3D Volume data support
  • Full access to layout setup
  • 3D Light/Fast/Wire modes
  • Flight over the surface regime
  • Square pixel smoothing
  • Variety of colored palettes
  • Palette editor for custom palettes
  • Fast screenshot tool
  • Presentation mode quick

Data Management

  • Import from Graphical format and ASCII
  • Export to:
    • Graphical formats
    • ASCII
    • Matlab

Tools

  • Single/Pair markers for 1D graphs
  • Point/Line/Angle tools
  • Zoom In / Zoom Out
  • Pan tool

Data Processing

  • Crop
  • Interpolation
  • Local Equalization
  • Filter generator
  • Fourier filtration
  • Flip/Rotate
  • Rescale
  • Cut Spikes
  • Remove scratches/spots/lines
  • Tip shape deconvolution
  • Flattening
    • Line by line flattening 0-10 orders
    • Surface flattening 0-3 orders
  • Batch processing tool

Data Analysis

  • Scanner calibration
  • Correlation analysis
  • Grain/Pore analysis
  • Fractal analysis
  • Data calculator
  • Fourier analysis
  • Roughness Analysis
    • ISO 4287
    • GOST 25142
    • ASME B46.1
  • Bearing Analysis
  • Section Analysis

Downloads

Undergraduate student manual

Accessories

STM head

STM measuring head for wire probes.

STM probe holder

STM holder is used with Universal AFM/STM head.

Wire probes tip ething device

Special probe etching (probe sharpening) device for making STM probes from tungsten wire.

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