Рус
Eng
+1-480-493-0093

Modular AFM

AFM systems for wide applications. Configuration possibilities for a special task.

NTEGRA
NTEGRA
Modular scanning probe microscope NTEGRA, configuration possibilities for a special task.

News

03.03.2021
PFM image of improper ferroelectric hexagonal (h-)ErMnO3 domain structure chosen by Journal of Applied Physics for February cover
22.12.2020
Integration of NTEGRA AFM with iXR confocal Raman system by Thermofisher Scientific
More news

Upcoming events

Last Сhance to Submit Your Abstract at SNAIA2020 Conference
December 8-11, 2020
XXV Symposium «Nanophysics & Nanoelectronics»
March 09-12, 2021
More events

Applications

Learn more

Features

Learn more

Scan-Gallery

Learn more
NT-MDT Spectrum Instruments