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Features

Intelligent ScanT™ Software
Make amplitude modulation AFM easy for researchers of every skill level.
RapidScan™
Speed up your AFM by an order of magnitude.
HybriD Mode™
Empowering simultaneous mapping of various material properties.
PX Ultra Controller
The new digital controller PX Ultra turns your routine SPM device into easy-to-use instrument for scientific breakthroughs and advanced research.
Thermal Cabinet
NT-MDT SI is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.
NTEGRA Marlin
Cutting-edge AFM-RAMAN-SICM System for Biological Studies
SThM - Scanning Thermal Microscopy
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.
SOLVER Pipe II
Atomic Force Microscope for in situ nondestructive testing in industrial settings

Applications

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Features

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Scan-Gallery

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