AFM Probes shop
Leading the Way in Nanoscale Analysis
Intelligent ScanT™ Software
Make amplitude modulation AFM easy for researchers of every skill level.
Speed up your AFM by an order of magnitude.
Empowering simultaneous mapping of various material properties.
PX Ultra Controller
The new digital controller PX Ultra turns your routine SPM device into easy-to-use instrument for scientific breakthroughs and advanced research.
NT-MDT SI is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.
Cutting-edge AFM-RAMAN-SICM System for Biological and Local Electrochemical Studies
SThM - Scanning Thermal Microscopy
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.
Mass changes measurements
Combination of QCM with dissipation monitoring with AFM allows to carry out simultaneous in situ observation of object topography (up to nm) and mass change (up to 0.3 ng).
NT-MDT Spectrum Instruments offers free AFM testing of your samples
Participation of NT-MDT Spectrum Instruments in the XXII. Annual Linz Winter Workshop
Invitation to Microscopy and Microanalysis 2020 Virtual Meeting
August 3-7, 2020
NT-MDT Spectrum Instruments