AFM Probes shop
Leading the Way in Nanoscale Analysis
HybriD Mode™ (HD-AFM™) is a new AFM mode for enhanced nano-mechanical and electromagnetic material properties mapping.
PX Ultra Controller
The new digital controller PX Ultra turns your routine SPM device into easy-to-use instrument for scientific breakthroughs and advanced research.
Mass changes measurements
Combination of QCM with dissipation monitoring with AFM allows to carry out simultaneous in situ observation of object topography (up to nm) and mass change (up to 0.3 ng).
NT-MDT SI is introducing a new THERMAL CABINET, which provides a low-thermal drift environment for scanning probe microscopes: NEXT, NTEGRA Prima, and Titanium.
SThM - Scanning Thermal Microscopy
Scanning Thermal Microscopy (SThM) is an advanced SPM mode intended for simultaneous obtaining nanoscale thermal and topography images. NT-MDT’s SThM kit is able to visualize temperature and thermal conductivity distribution at the sample surface.
NT-MDT Spectrum Instruments introduces the new PFM solution for fragile, soft and loose samples
NT-MDT SI Exhibits at MRS Fall Meeting & Exhibit 2017
255th ACS National Meeting & Exposition, Booth #222
18-22 Mar 2018
2018 MRS Spring Meeting & Exhibit, Booth #826
2-6 Apr 2018
Workshop on Nanomaterials Characterization. Purdue University , Discovery Park.
22-23 Mar 2018
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