|AFM-Raman-Nano-IR Systems||Modular AFM||Automated AFM||Practical AFM|
Atomic Force Microscope
for Research & Education.
AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.
Solver Nano - AFM for science.
Solver Nano is designed by the NT-MDT team that also created High Performancel Systems like Ntegra, NEXT and Spectra which have been proven in the scientific community through many key publications.
Solver Nano is equipped with a professional 100 micron CL (closed loop XYZ) piezotube scanner with low noise capacitance sensors. Capacitance sensors in comparison with strain gauge and optical sensors have lower noise and higher speed in the feedback signal. The CL scanner is controlled by a professional workstation and software.
These capabilities enable all of the basic (http://www.ntmdt.com/spm-principles) AFM techniques in compact SPM design.
Because the SolverNano can be employed in diverse areas of research as AFM tool, several research examples are shown below: :
The following samples were provided by Customers: Nitrocellulose membrane, Celgard, Polystyrene Polybutadiene (PS/PBD), Graphene.
|Configuration and experimental setup:
NSC_05/20° whisker cantilever was used which has a spring constant of 13 N/m and a resonance of 210 kHz.
Scanning parameters: 4.0x4.0 um scanning area with 512x512 points, and scanning rate of 1 Hz.
Sample: Nitrocellulose membrane.
Intermittent Contact mode results from a Nitrocellulose membrane sample.
Sample: Microporous Polypropylene (PP) Membrane (Celgard),
Intermittent Contact mode results from a Celgard sample;
A NSC_05/20° whisker cantilever was used which has a force constant of 13 N/m and resonance of 210 kHz.
Scanning parameters: 20 x 20 um and 5x5 um scanning areas with 512x512 points, and scanning rate of 3 Hz
Scanning parameters: 2.5x2.5 um scanning area with 512x512 points, and scanning frequency of 30 Hz
Sample: Polystyrene Polybutadiene (PS/PBD).
Intermittent Contact mode results from a phase separated blend of Polystyrene Polybutadiene (PS/PBD).
A NSC_05/20° whisker cantilever was used which has a spring constant of 12 N/m and a resonance of 201 kHz.
Scanning parameters: 20 x 20 um and 5x5 um scanning areas with 512x512 points, and scanning rate of 2.5 Hz.
Sample: Long DNA
It is important to note that all data was collected during an on-site demonstration without any filters applied to adjust the raw data.
Intermittent Contact mode results from long stands of DNA/Mica sample;
A NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 80 kHz.
Topography, amplitude and phase image were recorded simultaneously
Scanning parameters: 2.0x2.0 um scanning area with 512x512 points, and scanning rate of 0.8 Hz
Sample: Short DNA on Mica
Intermittent Contact mode results from short strands on DNA/Mica sample.
A NSG03 cantilever was used which has a force constant of 2 N/m and resonance of 80 kHz.
Topography and phase images were recorded simultaneously.
Scanning parameters: 1.5x1.5 um scanning area with 512x512 points, and scanning frequency of 0.7 Hz.
Sample: Circular DNA on Mica
Intermittent Contact mode results from circular DNA/Mica sample.
A NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 80 kHz.
Topography, amplitude and phase images were recorded simultaneously.
Scanning parameters: 900x900 nm scanning area with 512x512 points, and scanning rate of 0.5 Hz
Sample: Graphene on Si substrate
Topography and surface potential image were recorded simultaneously
A NSG03 cantilever was used which has a spring constant of 2 N/m and a resonance of 90 kHz.
Topography and surface potential were recorded simultaneously
Scanning parameters: 5.0x5.0 um scanning area with 512x512 points, and scanning rate of 1.1 Hz.
SOLVER Nano for metrology applications.
SOLVER Nano AFM can be used for educational / scientific projects as well as for routine measurements. It can also be used as a metrological tool for the determination of linear dimensions of objects in the nanometer range.
Technical requirements for metrology appliocations:
Sample: Metrology test sample TDG, period 278 nm.
Sample: Metrology test sample TGG, period 3 um
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning rate of 1 Hz
Sample: Metrology test sample TGZ2, period 3 um, relief height 94 nm.
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning frequency of 2 Hz
Sample: Metrology test sample TGQ, period 3 um, height 19 nm
Scanning parameters: 60.0x60.0 um scanning area with 512x512 points, and scanning rate of 3 Hz
|Atomic Force Microscopy
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Force Modulation microscopy
Piezoresponse Force Microscopy
Amplitude modulation AFM
Intermittent contact mode
Phase Imaging mode
Semicontact Error mode
Electrostatic Force Modes
Scanning Capacitance Microscopy
Kelvin Probe Force Microscopy
Dissipation Force Microscopy
Adhesion Force imaging
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
AFM Oxidation Lithography
AFM Lithography - Scratching
AFM Lithography - Dynamic Plowing
|Scanner||100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner|
|AFM resolution||0.01 nm|
|Environments||Air and liquid measurements.|
|Combined video optical microscopes||
Build in 100x optical USB microscope
External 500x optical microscope
|Design||Table-top, affordable, robust and user-friendly|
|Scanning field||High voltage regime: 100x100x12 um
Low voltage regime: 3x3x3 um
|Scanner type||Metrological piezotube XYZ scanner with sensors|
|Sensors type||XYZ – ultrafast capacitance sensors|
|Sensors noise||Low noise XY sensor: < 0.3 nm
Metrological Z sensor: < 0.03 nm
|Sensors linearity||Metrological XY sensor: < 0.1%
Metrological Z sensor: < 0.1%
|Overall scanner parameters||100x100x12 um with CL
Resolution: XY -0.3 nm, Z – 0.03 nm
Linearity: XY - < 0.1%, Z - < 0.1%
3x3x3 um with OL. Resolution: XY -0.05 nm,
Z – 0.01 nm
|Sample positioning range||12 mm|
|Sample positioning resolution||1.5 um|
|Sample dimension||up to 1,5” X 1,5” X 1/2”, 35x35x12 mm|
|Sample weight||up to 100 g|
|Approach system type||Z – Stepper Motor|
|Approach system step size||230 nm|
|Approach system speed rate||10 mm per min|
|Algorithm Gentle approach||Available (probe guaranteed to stop before it touches the sample)|
|AFM head for Si cantilever||Available. All commercial cantilevers can be used|
|Type of cantilever detection||Laser/Detector Alignment|
|Probe holders||Probe holder for air measurements. Probe holder for liquid measurements.|
|Type of AFM head mounting||Cinematically mount. Mount accuracy 150 nm
|STM AFM head for wire probes||Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements|
|Type of cantilever detection||Piezo for AFM measurement|
|Probe holders||Probe holder for air and liquid measurements|
Controllers. Digital professional controller
|Number of images can be acquired during one scanning cycle||Up to 16|
|Image size||Up to 8Kx8K scan size|
|ADC||500 kHz 16-bit ADC
12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000)
Individual filter on each channel
|DSP||Floating point 320 MHz DSP|
|Digital FB||Yes 6 Channels|
|DACs:||4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage
2 16-bit DAC for user output
|XYZ scanner control voltage||High-voltage outputs: X, -X, Y, -Y, Z, -Z
at -150 V to +150 V
Low-voltage mode XY ± 10 V
|XY RMS noise in 1000 Hz bandwidth||0.3 ppm RMS|
|Z RMS noise in 1000 Hz bandwidth||0.3 ppm RMS|
|XY bandwidth||4 kHz (LV regime – 10 kHz)|
|Z bandwidth||9 kHz|
|Maximal current of XY amplifiers||1.5 mA|
|Maximal current of Z amplifiers||8 mA|
|Integrated demodulator for X,Y,Z capacitive capacitance sensors||Yes|
|Open/Closed-loop mode for X,Y controlх||Yes|
|Generator frequency setting range||DC – 5 MHz|
|Deflection registration channel bandwidth||170 Hz-5 MHz|
|Lateral Force registration channel bandwidth||170 Hz -5 MHz|
|2 additional registration channel bandwidth||170 Hz -5 MHz|
|Bias Voltage||± 10 V bandwidth 0 – 5 MHz|
|Modulating signals supply||To the probe (external output);
High-voltage X,Y, Z channels
(including LV regime);
|Number of generators for modulation, user accessible||2, 0-5 MHz, 0.1 Hz resolution|
|Stepper motor control outputs||Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA|
|Additional digital inputs/ outputs||6|
|Additional digital outputs||1|
|Max. cable length between the controller and SPM base or measuring heads||2 m|
|Computer interface||USB 2.0|
|Voltage supply||110/220 V|
|Power consumption||≤ 110 W|
Software for SPM operation and Data processing
Software written by programmers NT-MDT and specialized management probe microscopes and associated devices (external and build-in) and also signal and image processing obtained with SPM. This software is used to manage all SPM from NT-MDT, but adapted for each model (Next, Ntegra, Solver Nano). In the case of use with Solver Nano, the software interface as much as possible easy and user-friendly.
- User-defined configurable GUI
- Basic and advanced GUI layouts
- Handy hardware configuration wizard
- Quick access for all main parameters
- Quick access to customized scripts
- Automatic single-click setup for all available techniques
- Interactive Help system
- Handy indication for laser alignment
- Automatic configuration for standard probes
- Automatic resonance tune and phase adjustment
- Automatic routine for tip-sample engagement
- Soft Approach gentle engagement routine
- Handy stepper motor control
- Real time engagement oscilloscope
- Up to 8 sumultaneous signal channels
- Up to 8K points
- Automated single-click scanning mode setup
- Handy scan area selection tool
- Two pass techniques
- Cyclic mode
- Pause tool
- PreScan regime
- OverScan regime
- Angle scanning
- Non-square pixel mode
- Live 3D view
- Quick access to main scanning parameters via Parameters panel
- Quick access to main tuning operations via Quick panel
- Automatic PID setup
- Adaptive scan
- Cross-sections for each and all scans
- Full-screen mode
- Variety of standard modes
- Available arguments: Height, BV, Frequency, SetPoint
- Up to 3 channels measured simultaneously
- Limits for each channel
- Independent setup for resolution and speed for trace and retrace
- Point/Multi Point/Line/Grid measurement modes
- Vector/Raster techniques
- Constant/Pulse/Gradient regimes
- Force/Voltage/Current modes
- Handy CAD for vector lithography
- Support for main graphical standards for raster lithography
- Scan Area / Litho Mask transparent overlay
- Real time signal control
- Average and RMS calculation
- Up to 4 simultaneous signals in the same window
- Multi-window view
- 4 different plot modes
- User markers for measurements
- Data save/export
- Trigger mode to synchronize with other processes
- Graphical control for controller schematics
- Access to digital filters
- Access to all Feedbacks parameters
- Closed-loop automatic setup and control
- Camera for optical view layout
- Scripting and Automation
- Nova PowerScirpt language for customized automation
- Support for external dll
- LabView support
- Script Panel for quick access to frequently used scripts
- Automation for all routine setup procedures
Data Processing and Analysis
- 1D/2D/3D View/3D Volume data support
- Full access to layout setup
- 3D Light/Fast/Wire modes
- Flight over the surface regime
- Square pixel smoothing
- Variety of colored palettes
- Palette editor for custom palettes
- Fast screenshot tool
- Presentation mode quick
- Import from Graphical format and ASCII
- Export to:
- Graphical formats
- Single/Pair markers for 1D graphs
- Point/Line/Angle tools
- Zoom In / Zoom Out
- Pan tool
- Local Equalization
- Filter generator
- Fourier filtration
- Cut Spikes
- Remove scratches/spots/lines
- Tip shape deconvolution
- Line by line flattening 0-10 orders
- Surface flattening 0-3 orders
- Batch processing tool
- Scanner calibration
- Correlation analysis
- Grain/Pore analysis
- Fractal analysis
- Data calculator
- Fourier analysis
- Roughness Analysis
- ISO 4287
- GOST 25142
- ASME B46.1
- Bearing Analysis
- Section Analysis
STM measuring head for wire probes.
STM probe holder
STM holder is used with Universal AFM/STM head.
Wire probes tip ething device
Special probe etching (probe sharpening) device for making STM probes from tungsten wire.
Fulfill a special form to request additional information.