Get 50 AFM Tips 4Free
Our company is proud to step in to a 4th decade of development and manufacturing of Atomic Force Microscopes (AFM) and AFM integrated systems. Success of our customers and our growth only confirms that we use latest technology in our systems and dellver worldwide the most accurate and reliable AFMs for nanotechnology research. As we are confident in our technology and services, we would like to share it with you.
If you are planning to purchase an AFM, AFM-Raman-TERS or nano-IR system soon or already in the process of choosing one, we would like to offer you a win-win deal. Send us your samples for free of charge measurements and compare data with other manufacturers. As we are sure that our systems in most cases will outperform other AFMs, we wil offer you a free pack of 50 cantilevers if our data is not as good as others. Moreover, if our data shows similar or better results, but our price exceeds other offers for the same tier AFM system, we will still grant you with a free 50 cantilevers pack.
Contact us, try our technology at no cost and choose the best AFM system that fits your research needs and, yet, doesn't eat up your entire budget. See what our customers have to say about collaboration with our company.
Users of NT-MDT S.I. systems around the Globe
Dr. Juan Hunestroza, Cornell University, USA:
"NT-MDT has been a great ally of my research group at Cornell University. They have gone to great extents to provide timely training and support to me and my students. I have had the privilege of visiting their headquarters in Russia and have seen the complete and unwavering dedication of their team to help their users all over the world. Often I am being asked for recommendations for AFMs, and my reply is simple: NT-MDT is the best not only in providing state-of-the-art instrumentation, but also their level of support is really unmatched. I have been a happy customer since 2006"
Dr. Tadeusz Pustelny, Poland:
"...We want to emphasize that the technical support and service has helped us whenever we needed help. Especially during the initial period of the service life and after we had to move our equipment to new premises. The technical service staff never left us without help, which is invaluable. They were always comprehensive and very polite. With our partners we always strongly recommend both the NT-MDT equipment and service."
Dr. Oleg Kolosov, United Kingdom:
"...Overall, the combination of hardware, and versatile controller and software meets the needs of both general SPM users with simple‐to‐use operation templates are provided, as well as advanced users developing entirely new scanning probe modes.
...I can congratulate you on the development of a new successful generation of NTEGRA instrument and greatly looking forward to our continuing collaboration."
Dr. Svitlana Fialkova, NC A&T State University, USA:
"...We do currently have NTEGRA platform that is highly customizable and has a lot of extra options, plus can be upgraded to include SPECTRA configuration that includes nano-Ramam, SNOM (IR-scattering scanning near-field optical microscopy) and TERS (Tip Enhanced Raman Scattering)...the company has great customer support services, I had only great experiences calling them for help and troubleshooting technical issues and discussion of experiments design and set-ups."