AFM-Raman-Nano-IR Systems
Modular AFM
Automated AFM
Practical AFM
 

Webinars

 

Archived Webinars

 

Dr. Sergei Magonov
 

Dr. Virgil Elings
 

Dr. Stanislav I. Leesment

New HD-AFM Mode; Your Path to Controlling Forces for Precise Material Properties

NT-MDT - Your AFM & Raman Company welcomes you to join our upcoming webinar about the new HybriD (HD-AFM) mode for enhanced nano-mechanical and material properties measurement.

Presenters: Dr. Virgil Elings and Dr. Sergei Magonov.

  • Dr. Elings received a doctorate in physics from MIT and holds more than 40 patents. Virgil is a leading entrepreneur in nanotechnology, a devoted educator, and a UCSB professor of physics for more than 20 years. In 1987, he co-founded Digital Instruments Inc. in Santa Barbara, bringing one of the first commercially-available scanning probe microscopes to the scientific community.
  • Dr. Magonov received a doctorate in physics and mathematics from the Moscow Institute of Physics and Technology. Sergei has published over 200 peer-reviewed papers, 1 book, and 15 book chapters. He is now CEO of NT-MDT Development, an R&D subsidiary that was established for the development of novel experimental and applications capabilities using NT-MDT microscopes. 


Atomic force microscopy (AFM) has rapidly become a powerful multifunctional characterization technique as further understanding of the tip-sample force interactions has led to the continuous development of new modes to measure and control them. The extraction of this useful information from the tip-sample interaction has fueled applications development from atomic-scale surface visualization to nano-scale material properties. Dr. Elings will present his perspective on how innovative modes emerged to solve challenging applications. Dr. Magonov will introduce the new HybriD mode technology, including the relationship to oscillatory resonant mode (e.g. intermittent contact) and oscillatory non-resonant mode (e.g. jumping) techniques. In addition, we will demonstrate the benefits of the new HybriD mode in concert with Single Pass multifrequency capabilities for the ultimate measurements of local material properties.

 
Dr. Pavel Dorozhkin

Raman-AFM & Tip Enhanced Raman Scattering (TERS). Pushing the limits of resolution and sensitivity in chemical imaging.

NT‐MDT ‐ Your AFM‐Raman‐SNOM Company welcomes you to join our upcoming webinar on Pushing the Limits of Resolution and Sensitivity in Chemical Imaging with Raman‐AFM.

Who should attend? Materials Scientists, Physicists, Chemists interested in:

  • TERS or “nano-Raman” imaging with the highest possible sensitivity and lateral resolution down to 10 nm
  • Real TERS mapping (2D Raman imaging with high resolution); distinguishing from possible artifacts
  • Reproducible TERS tips with high enhancement factors
  • AFM-Raman systems optimized for TERS
  • Scanning near-field optical microscopy (SNOM)

Raman Spectroscopy and Atomic Force Microscopy (AFM) have become vital tools in many areas of science and technology. AFM can measure electrical, mechanical and other physical properties with nanoscale resolution but it lacks chemical specificity. Confocal Raman spectroscopy conversely fills this gap but has the deficiency of being a diffraction limited technique. AFM Tip Enhanced Raman Scattering uniquely bridges this gap. We will discuss the fundamentals of the technique as well as the extended possibilities provided by the deep integration of AFM & Raman.

NT-MDT was the first company to introduce a commercially available AFM-Raman system in 1998. Since then NT-MDT has been a global leader for integrated AFM-Raman solutions with over 260 installations worldwide.

The webinar will be held on 26th and 27th of March, you may register for the time that best suits your schedule from the links below:

Tuesday, March 26, 2013 9:00 AM GMT
https://www4.gotomeeting.com/register/466451215

Wednesday, March 27, 2013 2:00 PM EDT
https://www4.gotomeeting.com/register/540590151

Can’t attend? We invite you to receive information
about future webinars and news... Please click here

[www.ntmdt.com/register]

Looking forward to your registration!

Please visit us at our booth for APS (American Physical Society March 19-21); Spring MRS (Materials Research Society April 2-3); Spring ACS (American Chemical Society April 7-9)

 
 
 
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