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SOLVER Nano Solver Nano - affordable AFM/STM system with advanced capabilities NANOEDUCATOR II NANOEDUCATOR II – educational scanning probe microscope

 

NANOEDUCATOR II

 

Educational scanning probe
microscope for students
and schoolboys
НАНОЭДЮКАТОР II – учебный сканирующий зондовый микроскоп (СЗМ, АСМ, СТМ) для преподавания основ зондовой микроскопии и нанотехнологии
Specifications Downloads Accessories Contact
 
AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.
 

Applications
 

Why is nanotechnology interesting for education?

Cutting edge achievements in science and most successful R&D projects in commercialization are on an interdisciplinary level, combining physics – chemistry –biology - mathematics – engineering – technology - IT. The earliest, widespread description of nanotechnology refers to the particular technological goal of precisely manipulating atoms and molecules for fabrication of macroscale products. Proceeding further down to atomic scale, where no border between the scientific disciplines exist and all of them are essential for developers and scientists to understand the technological processes.

Thus using this interdisciplinary approach to the education of students provides a very effective integration and coaches graduate students to fit into an innovative national economy. Scientific projects (school science, pre- college science and etc.) allow to cope with interdisciplinary connections, develop an interdisciplinary approach, form systematically scientific thinking and learn more about modern problems of physics, chemistry, biology and nanotechnology. This is the one of the mission of STEM centers.
 

Inter-chair resource center of collective use “Nanocenter” DSTU.
Laboratory work of students speciality “Nanomaterials”.


In the new scientific world of nanotechnology a widespread opinion persist that there are two important modern developments: the atomic force microscope (AFM) and the scanning tunnel microscopy (STM). Those are the instruments that have launched nanotechnology due to the fact that scanning probe microscopes are not limited by the wavelength of sound or light and can achieve high resolution results under a variety of environmental conditions..


     
HOPG atomic resolution, STM scan size 2×2 nm. Solver Nano on 100x100 um CL scanner.


SOLVER Nano is enabled for teaching principles of scanning probe microscopy and acquiring skills for studying nanoobjects and microstructures. Students can also perform all modern AFM and STM techniques with SOLVER Nano:

In Air: AFM (contact and intermittent contact), AFM spectroscopy, AFM lithography (force, current, voltage), Lateral Force Microscopy, Force Modulation Microscopy, Spreading Resistance Imaging, Piezoresponce Force Microscopy and Switching Spectroscopy, EFM, Kelvin Probe Force Microscopy, MFM, STM (microscopy, spectroscopy, lithography).
In liquid: Contact and Amplitude Modulation AFM, AFM Spectroscopy, AFM Force Lithography, Lateral Force Microscopy.

SOLVER Nano for education provides complete didactic materials for different skill levels of young aspiring scientists.
Basic level: to demonstrate various phenomena and develop skills to work on modern equipment.
Advanced level: designed for advanced studies with higher skilled students to provide insights on composite nature of modern research and interdisciplinary connections.
Research level: performed individually. Example are given on actual problems to demonstrate the structure of scientific research, form skills of designing and performing experiments, work with scientific advisers – tutors and prepare to engage in independent research.

Advanced project block scheme.
“synthesis and research properties of carbon materials”
 

 
 

The book atomic force microscopy written by V. Mironov is included. 
This book was translated into different languages and is very popular among NT-MDT customers.
Additional we provide a vast amount of freeware materials for education purposes.
Flash animation of SPM principles. 
Video presentation and video courses from “SPM in general” to “how to process the AFM image”.
Experience from our customers in practical and scientific work performed by young scientists.
 

Specifications

Atomic Force Microscopy

Contact AFM
Constant Height mode
Constant Force mode
Contact Error mode
Lateral Force Imaging
Spreading Resistance Imaging
Force Modulation microscopy
Piezoresponse Force Microscopy

Amplitude modulation AFM
Intermittent contact mode
Phase Imaging mode
Semicontact Error mode
Non-Contact mode
Electrostatic Force Modes
Contact EFM

EFM
Scanning Capacitance Microscopy
Kelvin Probe Force Microscopy

MFM
DC MFM
AC MFM
Dissipation Force Microscopy
AFM Spectroscopies
Force-distance curves
Adhesion Force imaging
Amplitude-distance curves
Phase-distance curves
Frequency-distance curves
Full-resonance Spectroscopy

STM techniques
Constant Current mode
Constant Height mode
Barrier Height imaging
Density of States imaging
I(z) Spectroscopy
I(V) Spectroscopy

Lithographies
AFM Oxidation Lithography
STM Lithography
AFM Lithography - Scratching
AFM Lithography - Dynamic Plowing

HD Modes

 

General specs:

Scanner 100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner.
AFM resolution 0.01 nm.
Environments Air and liquid measurements.
Combined video optical microscopes
Build in 100x optical USB microscope.
External 500x optical microscope.
Design Table-top, affordable, robust and user-friendly

Scanner
Scanning field High voltage regime: 100x100x12 um.
Low voltage regime: 3x3x3 um.
Scanner type     Metrological piezotube XYZ scanner with sensors.
Sensors type XYZ – ultrafast capacitance sensors.
Sensors noise Low noise XY sensor: < 0.3 nm.
Metrological Z sensor: < 0.03 nm.
Sensors linearity     Metrological XY sensor: < 0.1%
Metrological Z sensor: < 0.1 %
Overall scanner parameters 100x100x12 um with CL.
Resolution: XY -0.3 nm, Z – 0.03 nm. Linearity: XY - < 0.1%, Z - < 0.1%.
3x3x3 um with OL. Resolution: XY -0.05 nm, Z – 0.01 nm.

Sample
Sample positioning range 12 mm.
Sample positioning resolution 1.5 um.
Sample dimension up to 1,5” X 1,5” X 1/2”,   35x35x12 mm
Sample weight up to 100 g.
Approach system type Z – Stepper Motor
Approach system step size 230 nm.
Approach system speed rate 10 mm per min
Algorithm Gentle approach Available (probe guaranteed to stop before it touches the sample)

Scanning Heads
AFM head for Si cantilever Available. All commercial cantilevers can be used
Type of cantilever detection Laser/Detector Alignment
Probe holders Probe holder for air measurements. Probe holder for liquid measurements.
Type of AFM head mounting Cinematically mount. Mount accuracy 150 nm. (Remove/mount accuracy)
STM AFM head for wire probes Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements.
Type of cantilever detection Piezo for AFM measurement.
Probe holders Probe holder for air and liquid measurements.

Controllers. Digital professional controller
Number of images can be acquired during one scanning cycle Up to 16
Image size Up to 8Kx8K scan size
ADC 500 kHz 16-bit ADC
12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000)
Individual filter on each channel
DSP Floating point 320MHz DSP
Digital FB Yes 6 Channels
DACs: 4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage
2 16-bit DAC for user output
XYZ scanner control voltage High-voltage outputs: X, -X, Y, -Y, Z, -Z at -150 V to +150 V
Low-voltage mode XY ± 10 V
XY RMS noise in 1000 Hz bandwidth 0.3 ppm RMS
Z RMS noise in 1000 Hz bandwidth 0.3 ppm RMS
XY bandwidth 4 kHz (LV regime – 10 kHz)
Z bandwidth 9 kHz
Maximal current of XY amplifiers 1.5 mA
Maximal current of Z amplifiers 8 mA
Integrated demodulator for X,Y,Z capacitive capacitance sensors    Yes
Open/Closed-loop mode for X,Y controlх Yes
Generator frequency setting range DC – 5 MHz
Deflection registration channel bandwidth 170 Hz-5 MHz
Lateral Force registration channel bandwidth 170 Hz -5 MHz
2 additional registration channel bandwidth 170 Hz -5 MHz
Bias Voltage ± 10 V bandwidth 0 – 5 MHz
Modulating signals supply To the probe (external output);
High-voltage X,Y, Z channels (including LV regime);
Bias Voltage.
Number of generators for modulation, user accessible 2,  0-5 MHz, 0.1 Hz resolution
Stepper motor control outputs Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA
Additional digital inputs/ outputs 6
Additional digital outputs 1
I2C bus Yes
  Macro language
Max. cable length between the controller and SPM base or measuring heads 2 m
Computer interface USB 2.0
Voltage supply 110/220 V
Power consumption ≤ 110 W

 

Software for SPM operation and Data processing.
Software written by programmers NT-MDT and specialized management probe microscopes and associated devices (external and build-in) and also signal and image processing obtained with SPM. This software is used to manage all SPM from NT-MDT, but adapted for each model (Next, Ntegra, Solver Nano). In the case of use with Solver Nano, the software interface as much as possible easy and user-friendly.
 

Operation Interface

Laser alignment

Resonance

Approach

Scan

Curves

Lithography

Tools

Data Processing and Analysis

Data presentation

Data Management

Tools

Data Processing

Data Analysis

 

Downloads

Undergraduate student manual

Accessories

   

Universal AFM/STM head

AFM/STM measuring head for wire probes. Main techniques - amplitude modulation AFM, STM, spectroscopy, force lithography (Educational Kit).

 
   

Wire AFM probe holder

 AFM probe holder with piezotube resonance sensor for working in amplitude modulation mode. AFM holder is used with Universal AFM/STM head (Educational Kit).

 
   

STM probe holder

STM holder is used with Universal AFM/STM head (Educational Kit). 

 
   

Wire probes tip ething device

Special probe etching (probe sharpening) device  for making AFM/STM probes from tungsten wire (Educational Kit).

 

 

Contact

Fulfill a special form to request additional information.

 
 
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