|AFM-Raman-Nano-IR Systems||Modular AFM||Automated AFM||Practical AFM|
NT-MDT Spectrum Instruments traditionally supports the International Scanning Probe Microscopy conference
NT-MDT Spectrum Instruments traditionally supports the International Scanning Probe Microscopy conference, which is the 19th this year and takes place in Kyoto, Japan.
ISPM conferences provide an ideal occasion to present novel discoveries in theory, instrumentation and application of scanning probe microscopes. During the conference NT-MDT SI presents a new approach for compositional study of topography and electro-mechanical properties of soft and fragile samples. The new AFM mode named HybriD Piezoresponse Force Microscopy (HD PFM) allows simultaneous nondestructive investigation of surface morphology, mapping of quantitative nanomechanical properties and domain morphology of piezoelectrics and ferroelectrics.
We are glad to discuss the new HD PFM and other products at the booth till May 19th or via email@example.com any time.