|AFM-Raman-Nano-IR Systems||Modular AFM||Automated AFM||Practical AFM|
NT-MDT SI participates at 3rd Bologna SPM Workshop
NT-MDT Spectrum Instruments are proud to announce their participation at the 3rd Bologna SPM Workshop in association with our Italian partners Pra.Ma. This one day workshop will take place in the University of Bologna, Italy on July 14th 2017.
Representing NT-MDT Spectrum Instruments at this workshop is Dr Sergey Lemeshko which is the Head of European Sales who will deliver a talk on “Material contrast mapping with nanometer resolution by Apertureless Scanning Near-Field Microscopy”. Dr Lemeshko will deliver his talk in the morning session of the workshop as part of the Innovations in Scanning Probe Microscopy between 12.40-13.00hrs. Alongside Dr S. Lemeshko will be Dr V. Polyakov Head of R&D at NT-MDT Spectrum Instruments.
From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.
To view full details of the Programme for this workshop please visit our website via the following link http://www.cristallografia.org/uploaded/4072.pdf
For more details on NT-MDT Spectrum Instruments devices and upcoming Events please visit http://www.ntmdt-si.com/