AFM-Raman-Nano-IR Systems
Modular AFM
Automated AFM
Practical AFM
Model line
NEXT Fully automated AFM/STM system NEXT. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode,  STM, SPM, RAMAN, SNOM) TITANIUM OPEN Universal automated AFM/STM system OPEN. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM) VEGA Automated large-sample AFM VEGA

Cutting-edge Atomic Force Microscopy
techniques for large and multiple samples


General information


Ultimate imaging quality with build-in acoustic and vibration isolation, active thermostabilization, industry lowest 25 fm/√Hz optical beam deflection sensor noise and unique design of scanning-by-tip system allow routine high resolution imaging.

Equipped with 50+ AFM modes including HybriD mode: all cutting-edge nanomechanical, electrical and magnetic studies are available in basic configuration.

Smart ScanTronic™ algorithm for one-click optimization of scanning parameters. This is not just an algorithm, it is rather a unique companion that helps a newcomers in AFM to get industry quality images and assists the experts.
Automated study of samples arrays by user-defined scenario with database image storage.

Up to 200×200 mm and 40 mm in height samples inspection in any point with 1 µm positioning accuracy.




Automated inspection of large samples and samples arrays with ultimate positioning precision


VEGA is the first AFM that brings industry standard automation to all users:

  • All routine procedures like area of interest exchange, laser alignment, gentle approach and scanning parameters tuning are fully automated
  • Motorized sample positioning stage is correlated with optical image allowing 1 um positioning accuracy on 200×200 mm area
  • Prolongated serial measurements of large and multiple samples became easy and time-effective thanks to smart algorithms, user interface for multiple AFM measurements and database image storage



Ultimate resolution of closed-loop wide-range scanner and sensitivity of optical beam deflection (OBD) sensor

Our unique piezoscanner and control electronics design allow atomic resolution while saving wide, 100×100 μm scanning range.

HOPG atomic resolution

RMS height noise
  850 nm non-coherent superluminescent diode (SLD) source and special optical scheme design assures the lowest 25 fm/√HZ OBD sensor noise among commercial large-sample AFMs.

       Power spectral density of OBD sensor noise




Perfect environment for high-resolution measurements 

High-resolution measurements require exceptional level of acoustic and vibration isolation of AFM working environment. Build-in acoustic enclosure and active anti-vibration system makes VEGA perfect for demanding AFM studies.

Thermal drift is a challenging issue for high-resolution and long-term measurements especially for large-sample AFMs with massive mechanical parts. Unique design of fan free enclosure provides Vega with capability to operate at conditions of extraordinary temperature stability within 0.05 C. This guarantees the exceptional low thermal drift of less than 0.2 nm/min.




Most advanced set of AFM modes in basic configuration

HybriD (HD) mode:

  • Quantitative nanomechanical measurements (QNM) – mapping of Young's modulus and work of adhesion values
  • Fast Force Volume – recording of force-distance curves for each scanning point
  • HD Conductive Probe AFM (HD CP-AFM) –  non-destructive conductive measurements
  • HD Piezoresponse Force Microscopy (HD PFM) - non-destructive piezoresponse measurements
  • HD KPFM, HD SCM, HD EFM – single- and multifrequency electrostatic studies
  • HD MFM – magnetic studies
Self-assembled diphenylalanine peptide nanotubes: topography, adhesion, d2C/dZ2,
in-plane piezoresponse phase (direction of polarization), 8x8 µm


Multi-frequency electrical studies:

  • Single- and two-pass Amplitude and Phase Modulation Electrostatic Force Microscopy (EFM)
  • Single- and two-pass Amplitude and Phase Modulation Kelvin Probe Force Microscopy (KPFM)
  • Single- and two-pass Amplitude and Phase Modulation Scanning Capacitance Force Microscopy (SCFM)
Topography, Surface Potential and dC/dZ of self-assembled F14H20 on Si, 1.5x1.5  µm



High-resolution Magnetic Force Microscopy (MFM):

New CoFe Ethalon catilevers allows better than 30 nm MFM resolution and ultimate signal-to-noise ratio. Together with 200×200 mm XY motorized stage this makes VEGA a perfect tool for data storage inspection.

HDD servo sector,
10x10 µm

Full list of AFM modes avaliable in basic configuration:

Contact AFM: Topography, Lateral Force, Force Modulation, Spreading Resistance Imaging

Amplitude modulation AFM: Topography,  Phase, Feedback

HybriD mode AFM: Topography, Young’s modulus, Work of Adhesion, Viscoelectisity,  Current, Piezoresponse Force Microscopy, Fast Force Volume

AFM spectroscopy: Force-distance, Amplitude-distance, Phase-distance, I(V), I(Z)

Magnetic Force Microscopy: Two-pass and Frame Lift DC/AC

Electrostatic Force Microscopy: Single-pass and Two-pass Amplitude Modulation, Frequency Modulation

Scanning Capacitance Force Microscopy: Single-pass and Two-pass Amplitude Modulation, Frequency Modulation (dC/dZ and dC/dV imaging)

Kelvin Probe Force Microscopy: Single-pass and Two-pass Amplitude Modulation, Phase Modulation

Piezoresponse force microscopy & Switching Spectroscopy

Voltage, Current, Force





High-resolution failure analysis and roughness measurements of large samples


200x200 mm XY motorized stage together with low-noise scanning-by-tip system and variety of unique NT-MDT SI AFM probes allow failure and roughness analysis of large and heavyweight samples with 30 pm vertical resolution. This feature is now available for users of any skills thanks to automated scanning parameters adjustment.


Conventional AFM probe with 3:1 aspect ratio

NT-MDT SI Whisker type probe with >10:1 aspect ratio

Microporous nitrocellulose
membrane, obtained
by NT-MDT SI Whisker
type probe with 12:1
aspect ratio, 30x30  µm


Advanced studies in a field of microelectronics, MEMS and data storage

Magnetic domains
of high-density HDD

Surface potential of SRAM

Powerful set of surface characterization modes like Kelvin Probe Force Microscopy, Magnetic Force Microscopy, Piezoresponce Force Microscopy, Capacity and Conductivity mapping makes VEGA AFM irreplaceable tool for research and control applications in a field of modern micro- and nanoelectronics, MEMS, NEMS and data storage.

Customizable easy-to-exchange sample holders allow variety of applications including wafer inspection, multiple samples study etc.



Routine multiple AFM measurements

Mechanical design and control software of VEGA AFM was developed to make frequent AFM measurements easy and time-effective. Fully automated operation, user interface for serial AFM measurements, database image storage and customizable sample holder allow to setup and simply investigate any array of samples.


DNA plasmids
on MICA, 2x2  µm
PS-b-PMMA, 2.5x2.5  µm





Measuring heads

Standard AFM head for traditional AFM probes. Enables operation with the majority of commercial probes


Type: tube scanner with closed loop sensors. Scanning by tip

Scanning range, XYZ: 100×100×10 µm or 2×2×1 µm in Low Voltage Mode 

Closed loop: Available for all Directions: XYZ

Drive electronics noise <5 µV/√Hz

Tip-Sample Positioning

Type: motorized sample positioning in XYZ

XYZ thermal drift: Less than 0.2 nm/min

Moving range: 200×200 mm in XY, 30 mm in Z
Positioning accuracy: 1 µm in XY, 0.2 µm in Z
Positioning speed: 8 mm/sec in XY
Navigation: automated multiple scanning by user-defined scenario, by video image, 3D mouse compatible  
Approach: smart soft approach algorithm

Optical Sensor

Light source: 850 nm LSD with FC single mode fiber, optional LDM and SLD sources of different wavelengths

Optical system adjustment: automated

Optical beam deflection sensor noise: <25 fm/√Hz above 50 kHz

Optical Microscope

Type: motorized focus, digital zoom and XY positioning. Correlated with sample and laser position

Resolution: 0,98 μm
Field of view: up to 1.2×0.8 mm (5 Mpixel)
Autofocus: on cantilever, on sample


Variety of sample holders

150 V bias voltage  extension
Signal Access Module
AFM probes: probe holder supports most commercially available probes
  Electronics & Software

Number of scan channels: up to 24
Signal processing: 512 Mb buffer Size, 3x 340 MHz FPGA, 320 MHz DSP
Lock-in amplifiers: 2x analog lock-in amplifiers, 3x digital lock-in amplifiers (Multifrequency AFM modes supporting)
Generators: 6x 32 bit digital generators, 4x for Lock-in
BV: +/- 10 V AC and DC (independent sample and tip voltage supply), +/- 150 V AC and DC (optional)
Self-testing: automated performance check

Scanning parameters auto adjustment: drive amplitude, lock-in gain, setpoint, feedback gain, scanning rate

Automatic configuration of advanced modes

Automation Features: optical system adjustment, multiple scanning on 200×200 mm range by user-defined scenario, overlay of optical and AFM images, panoramic optical view, place of interest saving, autofocus on cantilever, autofocus on sample

Programming tools: Nova PowerScript language, LabView integration, Database integration

Database storage of obtained images

PC interface: USB

Environmental Protection

Temperature stabilization: build-in fan free thermal stabilization with 0.05 degree C accuracy

Acoustic isolation: build-in acoustic enclosure
Vibration isolation: build-in active vibration isolation table

Basic Set of Modes

Contact mode: Topography, Lateral Force, Force modulation, Spreading Resistance, Piezoresponse Force Microscopy, Contact Resonance Microscopy
Amplitude modulation mode: Topography, Phase Imaging, Single- and Two-pass Kelvin Probe Force Microscopy with Phase and Amplitude Modulation, Two-pass and Frame Lift Magnetic Force Microscopy, Single- and Two-pass Electrostatic Force Microscopy, Single- and Two-pass Scanning Capacitance Force Microscopy (dC/dZ and dC/dV imaging)
HybriD mode: Topography,Young's modulus QNM for 104 to 1011 Pa,  Work of Adhesion QNM, Force Volume, Current, Piezoresponse, Viscoelasticity, Kelvin Probe Force Microscopy with Phase and Amplitude Modulation, Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Capacitance Force Microscopy (dC/dZ and dC/dV imaging)
Nanolithography: Voltage, Current, Force (All Vector and Raster)
Spectroscopy: Force-, Amplitude-, Phase-, Frequency-, Current-Distance, I(V), Piezopulse, Custom mode


W×L×H: 810×610×1450 mm
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