|AFM-Raman-Nano-IR Systems||Modular AFM||Automated AFM||Practical AFM|
The Highest Performance AFM
The TITANIUM Atomic Force Microscope (AFM) incorporates revolutionary developments of NT-MDT to provide the highest level of performance and ease of use. Featuring the Revolution Cartridge for Multi-probe Cartridge operation and innovative HybriD mode paired with low noise and low drift performance TITANIUM sets a new standard in atomic force microscopy.
High Resolution Imaging
Advanced characterization techniques
|With its wide variety of techniques and modes of probe measurements, the TITANIUM measurement complex is applicable for many challenges in science and technology. Scanning with atomic resolution that by TITANIUM can offer is of high demand in physicochemical research of solid surfaces, low-dimensional nanostructures, and nanomaterials.
Surface morphology analysis provides parameters of roughness, texture, and anisotropy of the sample surface as well as distributions of adsorbed particles and geometrical characteristics of those particles.
Dedicated gentle scanning techniques are now available to study powders, soft materials, biological structures, biomolecules, biopolymers, and to perform measurements in liquid.
|A peculiar place in applications of TITANIUM is taken by material science. It includes study of adhesion characteristics, friction factors, wear resistance of coatings, elasticity moduli, hardness etc.
Wide variety of techniques for measurement of electrical characteristics implemented in TITANIUM (local resistance, surface potential, capacitance, photovoltaic parameters) enables analysis of various functional structures, components of micro-, nano- and molecular electronics, and sensors of many types.
TITANIUM offers comprehensive capabilities to study ferroelectrics in terms of their domain structure, hysteresis properties, and thermal characteristics.
Revolution Cartridge for Multi-probe Cartridges. Enables Automated Cantilever Replacement with Full Tuning
Standard AFM Head for traditional single chip probes for traditional AFM cantilevers. Enables operation with the majority of commercial probes
AFM Head for Liquid Studies
Type: Tube Scanner with Closed Loop Sensors, Scanning by Sample
Scanning range, XYZ: 100×100×10 or 2×2×0.2 in Low Voltage Mode
Closed loop: Available for all Directions: XYZ
Noise: <300 pm in XY and <30 pm in Z for Closed Loop, <30 pm
in XYZ for Opened Loop
Drive electronics noise < 5 uV/√Hz
Type: Motorized Sample positioning in XYZ
XYZ Thermal Drift: <0.2 nm/min
Moving Range: 5×5 mm in XY, 10 mm in Z
Navigation: Place of Interest Saving, Navigation by Mouse
Click on Video Image, 3D Mouse Compatible, Automated Multiple Scanning
Approach: Smart Soft Approach Algorithm
Type: Motorized Focus, Zoom and XY positioning. Calibrated with Sample and Laser Position
Resolution: 2 μm
Field of View: up to 2×2 mm (1 Mpixel), up to 7×7 mm using automated panoramic optical view (50 MPixel)
Autofocus: on Cantilever, on Sample
Video Recognition: Cantilever Position
Zoom: Motorized Continuous Optical Zoom
AFM Liquid Head: Contact mode, AC mode, HybriD mode, Spectroscopy
STM Measuring Head: Constant Height and Constant Current Topography, Barrier Height, States Density, I(V) Curves, I(Z) Curves
Nanoindenter Measuring Head: Sclerometry, Indenting, Measuring Approach Curves. Range of Measured quantitaties: 1‑80 GPa for Hardness, 1-1000 GPa for Elasticity modulus
Heating Stage: from RT to 150 0C
Signal Assecc Module +/- 50 V Voltage Extender
AFM tips: Variety of Single Chip AFM Cantilevers
Multi-probe Cartridges with 38 cantilevers of different types and coatings
|Electronics & Software
Number of scan channels: virtually unlimited. More than 16 independent simultaneous scan channels supported
Signal Processing: 512 Mb Buffer Size, 3x 340 MHz FPGA, 320 MHz DSP
Lock-in Amplifiers: 2x Analog Lock-in Amplifiers, 3x Digital Lock-in Amplifiers (Multifrequeny AFM modes supporting)
Generators: 6x 32 bit Digital Generators, 4x for Lock-in
BV: +/- 10 V AC and DC (Independent Sample and Tip Voltage Supply), +/- 50 V AC and DC (Optional)
Self-testing: automated performance check
Maximum Scan Points: 8000×8000 Points
Scanning Parameters Auto Adjustment: Driving Amplitude, Lock-in Gain, Setpoint, Feedback Gain, Scanning Rate, Advanced Modes Configuration
Automation Features: Optical System Adjustment, Multiple Scanning on 5×5 mm Range with Scan Stitching, Overlay of Optical and AFM images , Panoramic Optical View, Place of Interest Saving, Autofocus on Cantilever, Autofocus on Sample
Programming tools: Nova PowerScript Language, LabView Integration
Light source: 850 nm
Optical System Adjustment: Automated in Air and Liquid
Optical Beam Deflection Sensor Noise: <25 fm/√Hz above 100 kHz
Thermal Stabilization: Temperature Control in Acoustic Enclosure
Acoustic Isolation: Acoustic Enclosure, Motorized Build-in Protective Cover
Seismic Isolation: Active Vibration Isolation Table
Routine Atomic Resolution: in air and liquid
Basic Set of Modes
Contact mode: Topography, Lateral Force, Force modulation, Spreading Resistance, Multifrequency Piezo Force Microscopy, Contact Resonance Microscopy
Amplitude modulation mode: Topography, Phase Imaging, Single and Double Pass Kelvin Probe Force Microscopy with Phase and Amplitude Modulation, Double Pass and Lift Magnetic Force Microscopy, Single and Double Pass Electrostatic Force Microscopy, Single and Double Pass dC/dZ and dC/dV microscopy
HybriD mode: Topography, Elasticity modulus, Lift and Land Adhesion, Work of Adhesion, Current, Viscoelasticity
Nanolithography: Voltage, Current, Force (All Vector and Raster), Nanomanipulation Spectroscopy: Force-, Amplitude-, Phase-, Frequency-, Current-Distance, I(V), Piezopulse, Custom mode
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