AFM-Raman-Nano-IR Systems
Modular AFM
Automated AFM
Practical AFM
 
Model line
NEXT Fully automated AFM/STM system NEXT. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode,  STM, SPM, RAMAN, SNOM) TITANIUM OPEN Universal automated AFM/STM system OPEN. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM) VEGA Automated large-sample AFM VEGA
 

OPEN



Universal fully automated desktop AFM

 
 

General information

OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniques.

The largest suite of AFM and STM modes
PX Ultra controller realizes advanced modes of AFM operation for characterization of electrical, magnetic and nanomechanical properties of the sample.
Low noise performance
The OPEN provides high performance with low noise characteristics. At the heart of the system is a low level of cantilever deflection noise and a robust design of the mechanical loop between the sample and probe achieving 15 pm intrinsic noise in a 1 kHz bandwidth. In addition, the low noise closed loop capacitance sensors and low noise high voltage amplifier of the PX Ultra controller satisfy demanding high resolution imaging requirements.
Low drifts and high stability
The drift level of the OPEN is ~30 nm/hour. Using the optional thermally stabilized acoustic enclosure allows decreasing this value down to ~10 nm/hour. This provides stable data acquisition even during long-term, ultimate resolution, experiments.
 
Wide range of samples of different size
All experiments begin with the sample. The OPEN can be used in either scanning-by-sample or scanning-by-probe configurations. Scanning-by-sample configuration is optimized for small samples and ultimate resolution experiments. Scanning-by-probe configuration is convenient for larger samples, for example 2-inch diameter wafers or standard microscope slides.
Sample temperature and environment control
A variety of optional sample stages for the OPEN allow heating or cooling the sample and performing experiments in different environmental conditions like liquid or controlled atmosphere
Gentle approach algorithm
Probe sharpness is critical for acquiring perfect AFM images, but sometimes the probe might be damaged during the approach proce-dure even before the beginning of the experiment. NT-MDT has deve-loped a phase sensitive algorithm that guaranties gentle approach.

 

 

 

 

Downloads


Application notes

  • Piezoresponse Force Microscopy in Its Applications AN 083  (1,86 Mb)
    Size: A4 or Letter
  • Exploring Materials with AFM-based Electrostatic Modes AN 084  (2,12 Mb)
    Size: A4 or Letter
  • Exploring Nanomechanical Properties of Materials with Atomic Force Microscopy AN 085  (1,58 Mb)
    Size: A4 or Letter
  • Next Scanning Probe Microscope: Visualization of Surface Nanostructures and Morphology AN 086  (1,87 Mb)
    Size: A4 or Letter
  • Expanding AFM with HybriD Mode Imaging AN 087  (2,71 Mb)
    Size: A4 or Letter
  • High-Resolution Imaging in Different Atomic Force Microscopy Modes. Summary AN 088s  (1,13 Mb)
    Size: A4 or Letter
  • High-Resolution Imaging in Different Atomic Force Microscopy Modes AN 088  (1,73 Mb)
    Size: A4 or Letter
 

Applications

With its wide variety of techniques and modes of probe measurements, the OPEN measurement complex is applicable for many challenges in science and technology. Scanning with atomic resolution that by OPEN can offer is of high demand in physicochemical research of solid surfaces, low-dimensional nanostructures, and nanomaterials.
 
   
HOPG, topography image. AM AFM. Scan size 1.5×1.5 μm   Alkanes C60H122. AM-AFM. Scan size 400×400 nm   DNA on mica, topography. AM AFM. Scan size 1×1 μm
   
Celgard, AM-AFM. Scan size 1×1 μm   Calcite atoms, AM-AFM in water. Scan size 11×11 nm   Fluoroalkanes F14H20, AM-AFM. Scan size 500×500 nm
Wide possibilities of the instrument as an example for studying the properties of graphene are well represented here.  
 

Specifications


Measuring modes and techniques
 

Contact AFM, Amplitude Modulation AFM, AFM spectroscopy, AFM lithography (force, current, voltage), Raster Spring Imaging, LFM, FMM, Spreading Resistance Imaging, PFM and Switching Spectroscopy, EFM, Kelvin Probe Force Microscopy,
MFM, STM.
 

Scanning-by-sample configuration
 
Sample size: up to 30 mm in diameter, up to 24 mm in height
 
Scanning range:
  • 100 × 100 × 10 μm (CL)
  • 3 × 3 × 2.5 μm
  • 1 × 1 × 2.5 μm
     
Automated sample positioning system:
  • XY travel range: 15 × 15 mm
  • Minimal step: 0.3 μm
  • Optical encoders: available up on request
     
Sample temperature and environment control:
  • RT .. 150 °C in air
  • RT .. 65 °C in liquid
     
Top view optics: Resolution: 1 μm
 
Scanning-by-probe configuration
 
Sample size: up to 50 mm in diameter (up to 100 mm diameter wafer is possible with limited XY sample positioning range), up to 24 mm in height
 
Scanning range: 100 × 100 × 10 μm (CL)
 
Automated sample positioning system:
  • XY travel range: 35 × 35 mm
  • Min step: 0.3 μm
     
Sample temperature and environment control:
  • -20 .. 150 °C in air
  • RT-15 .. 65 °C in liquid
  • Electrochemical cell
     
Top view optics: Resolution: 2 μm
 

Contact

Fulfill a special form to request additional information.

 
 
 
Copyright © 2015 - 2017, NT-MDT SI