AFM-Raman-Nano-IR Systems
Modular AFM
Automated AFM
Practical AFM
 
Model line
NEXT Fully automated AFM/STM system NEXT. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode,  STM, SPM, RAMAN, SNOM) TITANIUM OPEN Universal automated AFM/STM system OPEN. NT-MDT – AFM-probes, atomic force microscope (AFM, HybriD Mode, STM, SPM, RAMAN, SNOM) VEGA Automated large-sample AFM VEGA

Accessories

 
   

Measuring in liquid

Auxiliary measuring head and open liquid cell for measuring in liquid
 
   

Nanosclerometry head

Auxillary head for
  • Nanoindentation
  • Scratch hardness  
  • Elastic modulus mapping
 
   

Heating stage

Temperature control of the sample: from the RT up to 150 oC

 
   

Joystick

  • Manual control of  sample x-y moving and videocamera x-y moving, zoom, focus
  • Manual control of scan data 3D presentation
 
   

AFM probes

NT-MDT offers a wide assortment of SPM probes, ranging from the routine silicon and polysilicon cantilevers to ultra-sharp diamond-like carbon tips, probes with different coatings, for magnetic measurements, probes for SNOM and many others:
contact, conductive contact, noncontact and conductive noncontact.
 
 
 
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